Invited Talk: Basics and definitions for Laser Testing of Single-Event Effects

• Vincent POUGET (IES - CNRS)

Room: Newton 2 The laser method for Single-Event Effects testing is based on the photoelectric interaction of a short and focused laser pulse with the semiconductor material of a device to mimic the transient and localized track of electron-hole pairs that is produced by primary or secondary ionizing particles from radiation environments. We will briefly introduce the fundamentals of the laser testing technique, including an overview of the physical and experimental parameters of the main variants of the technique as well as their main advantages and limitations. Useful concepts like the laser cross section and the equivalent linear energy transfer will be defined and illustrated by recent results. Elements of methodology will be presented together with practical guidelines for an efficient and pertinent use of the laser testing technique for characterizing SEEs in modern devices.

Invited Talk: Historical look at the Development of the Focused, Pulsed Laser for SEE Testing of Integrated Circuits

• Steve BUCHNER (NRL)

Room: Newton 2 SEE testing using a focused, pulsed laser has reached a level of maturity that the technique is now widely employed in many laboratories around the world to supplement and complement heavy-ion testing. This has led to the publication of a handbook on focused, pulsed SEE laser testing to help those with little experience in optics perform SEE testing successfully and to present a series of steps that could lead to the development of a Standard. At this point, it is appropriate to look back over the years and recall the many contributions by several research groups to the development of the technique.

Visit of the Materials & Electrical Components Laboratory Room: Newton 2