31 May 2022 to 2 June 2022
WebEx
Europe/Amsterdam timezone

Early in the loop MBSE assessment of electronic availably for Nano/Micro satellite mission

2 Jun 2022, 11:45
30m
WebEx

WebEx

Speaker

Mr Guillaume Brau (IRT Saint-Exupery)

Description

Electronic Commercial-off-the-Shelf (COTS) component such as System-On-Chip (SoC) are key enablers for high processing with wide flexibility, but they remain sensitive to cosmic radiations as they are not physically hardened. Therefore, a fine analysis is necessary to find the good compromise between protection, mitigation, redundancy and mission availability.The study addresses a fast and flexible SEE sensitivity analysis, to enable early design evaluation with calculation of mission availability at functional chain level and then merged at system level. Model-based methods help system engineers to understand the FDIR measures and to evaluate the mitigation mechanism in relation to their efficiency, cost and benefits to satellite mission availability. The method allows analysing the white box SoC subsystem, to identify, detect and mitigate failures of hardware part and to analyse the impacts on the functional chain. The results are then merged at the system level to follow a classic black box analysis. A trade-off analysis is performed by evaluating the cost of integration to compare the impact of mitigation on availability against its cost. The method is built with the Capella system engineering tool environment. A viewpoint for availability assessment is designed. It allows modelling a non-functional FDIR element and mitigation mechanism, capturing parameters necessary, calculating availability in a non-intrusive way on the functional architecture deployed on the physical architecture. Special attention is devoted to check whether this viewpoint can be shared/split with other safety analysis. The final system availability carried out under static analysis conditions is integrated into Capella, assisted with graphical support for trade-off analysis.

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