Name: RADLAS 2024 : 6th Workshop on Laser Testing of Radiation Effects on Components and Systems
Start: 2024-09-11T08:45:00+02:00
End: 2024-09-12T12:00:00+02:00
Location: ESA-ESTEC

RADLAS 2024 : 6th Workshop on Laser Testing of Radiation Effects on Components and Systems

from Wednesday, 11 September 2024 (08:45) to Thursday, 12 September 2024 (12:00)

Monday, 9 September 2024
Tuesday, 10 September 2024
Wednesday, 11 September 2024

09:00 Coffee
Coffee
09:00 - 09:30
Room: Newton 2

09:30

09:30 - 09:40
Room: Newton 2
09:40 Invited Talk: Basics and definitions for Laser Testing of Single-Event Effects - Vincent POUGET (IES - CNRS)
Invited Talk: Basics and definitions for Laser Testing of Single-Event Effects
- Vincent POUGET (IES - CNRS)
09:40 - 10:10
Room: Newton 2 The laser method for Single-Event Effects testing is based on the photoelectric interaction of a short and focused laser pulse with the semiconductor material of a device to mimic the transient and localized track of electron-hole pairs that is produced by primary or secondary ionizing particles from radiation environments. We will briefly introduce the fundamentals of the laser testing technique, including an overview of the physical and experimental parameters of the main variants of the technique as well as their main advantages and limitations. Useful concepts like the laser cross section and the equivalent linear energy transfer will be defined and illustrated by recent results. Elements of methodology will be presented together with practical guidelines for an efficient and pertinent use of the laser testing technique for characterizing SEEs in modern devices.
10:10
10:10 - 11:10
Room: Newton 2
Contributions

10:10 SEE Laser testing at ESA - Thomas BOREL (TEC-QEC)

10:30 Exploration of the Single Event Effect Sensitivity of a 16nm FinFET System-on-Chip using Single-Photon Absorption Laser Testing - Matthieu FONGRAL (IES)

10:50 Single-Event Effects Laser Testing of a 7nm FinFET System-on-Chip with AI-Acceleration Capabilities - salma ACHAQ (ONERA/IES)
11:10 Coffee Break
Coffee Break
11:10 - 11:40
Room: Newton 2

11:10 - 11:40
Room: Newton 2
11:40
11:40 - 12:20
Room: Newton 2
Contributions

11:40 Pulsed-Laser Single-Event Effects in Wide Bandgap Semiconductor Devices - Ani KHACHATRIAN (US Naval Research Laboratory)

12:00 Laser Fault Injection on power off devices - Paul GRANDAMME (Laboratoire Hubert Curien, Université Jean Monnet, CNRS)
12:20
12:20 - 13:00
Room: Newton 2
Contributions

12:20 Pre-screening and classification of sensitivity of COTS parts to Single Event Latchup, based on Pulsed Laser testing - Samuel DUBOS (TRAD Tests & Radiations)

12:40 Comparison and Applications of Different Scanning Methods using an Industrial Laser System Dedicated to Single Event Effects Testing - Sebastien JONATHAS (PULSCAN)
13:00 Lunch Break
Lunch Break
13:00 - 14:20
Room: Newton 2
14:20 Invited Talk: Historical look at the Development of the Focused, Pulsed Laser for SEE Testing of Integrated Circuits - Steve BUCHNER (NRL)
Invited Talk: Historical look at the Development of the Focused, Pulsed Laser for SEE Testing of Integrated Circuits
- Steve BUCHNER (NRL)
14:20 - 15:00
Room: Newton 2 SEE testing using a focused, pulsed laser has reached a level of maturity that the technique is now widely employed in many laboratories around the world to supplement and complement heavy-ion testing. This has led to the publication of a handbook on focused, pulsed SEE laser testing to help those with little experience in optics perform SEE testing successfully and to present a series of steps that could lead to the development of a Standard. At this point, it is appropriate to look back over the years and recall the many contributions by several research groups to the development of the technique.
15:00
15:00 - 16:00
Room: Newton 2
Contributions

15:00 A Historical Overview of Ion/Laser Correlation Efforts - Adrian ILDEFONSO (U.S. Naval Research Laboratory)

15:20 Enabling Capabilities for Predictive Testing Using Pulsed Lasers - Joel HALES (U.S. Naval Research Laboratory)

15:40 A comparison of heavy ion and laser SEE test data for analogue and digital parts - Richard SHARP (Radtest Ltd)
16:00 Coffee Break
Coffee Break
16:00 - 16:30
Room: Newton 2

16:00 - 16:30
Room: Newton 2
16:30
16:30 - 17:30
Room: Newton 2
Contributions

16:30 Laser SEE Testing of Commercial SRAMs and Correlation with Heavy Ion Data - Mario SACRISTAN BARBERO (Univ. Montpellier - CERN)

16:50 Comparison between Laser and Heavy Ions test results from NSSC - Yingqi MA

17:10 Investigating Energetic Heavy Ions in The Solar System with the Juice Mission - Marco PINTO (ESA)
17:30

17:30 - 18:30
Room: Newton 2
Thursday, 12 September 2024

10:00 Visit of the Materials & Electrical Components Laboratory
Visit of the Materials & Electrical Components Laboratory
10:00 - 11:00
Room: Newton 2