Speakers
Dr
Hipolito Guzman Miranda
(Universidad de Sevilla)Dr
Miguel A. Aguirre
(Universidad de Sevilla)
Description
Fault injection over an integrated circuit is a procedure that mimics the consequences of Single Event Effects within radiation environments, and checks, when they are transformed into faults, how are they managed by the circuit logic. During the normal flight time of the integrated circuit, radiation is one of the most relevant source of anomalies of the circuit functional behavior. Impacts of energetic particles on critical points can change the current state of a digital circuit driving it to an unexpected evolution and to unpredictable consequences.
The present abstract pursues the clarification of the role of fault injection in the context of radiation and radiation testing. If radiation is a big concern in the context of microelectronics for space applications, fault injection can help to analyze part of the problem, understanding well its limits and its role within the problem.
Fault injection has been traditionally intended to be part of the set of tests just before the tapeout of an ASIC or the configuration of an FPGA. Authors have experienced that there is its use can be even richer if used as a design tool. Both roles, design and test, will be further analyzed.
Primary authors
Dr
Hipolito Guzman Miranda
(Universidad de Sevilla)
Dr
Miguel A. Aguirre
(Universidad de Sevilla)
Co-authors
Mr
Agustin Fernandez-Leon
(European Space Agency)
Mr
David Merodio Codinachs
(European Space Agency)
