Conveners
Design for Space Applications: Tools
- David Merodio Codinachs (ESA)
Prof.
Luca Sterpone
(Politecnico di Torino)
16/09/2014, 11:30
Single Event Upsets on SRAM-based FPGAs is a hot topic for more than a decade. After different investigations have been performed, a first algorithm for the prediction of SEU error probability on circuits on SRAM-based FPGAs is presented and analyzed by software prediction and fault injection analysis. Experimental results and comparison with other methods such as Xilinx Essential Bits report...
Dr
Hipolito Guzman Miranda
(Universidad de Sevilla), Dr
Miguel A. Aguirre
(Universidad de Sevilla)
16/09/2014, 12:00
Fault injection over an integrated circuit is a procedure that mimics the consequences of Single Event Effects within radiation environments, and checks, when they are transformed into faults, how are they managed by the circuit logic. During the normal flight time of the integrated circuit, radiation is one of the most relevant source of anomalies of the circuit functional behavior. Impacts...
Prof.
Luca Sterpone
(Politecnico di Torino)
16/09/2014, 12:30
Transient Pulse broadening is a realistic phenomena induced by high-energy
particles in deep-submicron technology. Electrical filtering has been demonstrated to be an effective solution to reduce the overall SET broadening effect. In this presentation an approach based on the Place and Route algorithm is presented and commented with a realistic application to Flash-based FPGAs.
