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12th Geant4 Space Users Workshop

10–12 Apr 2017
Europe/London timezone

Session

Software tools

11 Apr 2017, 15:40

Conveners

Software tools

  • Dennis Wright (SLAC)

Presentation materials

There are no materials yet.

  1. 10. Geant4-based tools in SPENVIS
    Dr Neophytos Messios (BIRA-IASB)
    11/04/2017, 15:40
    For some time now, various Geant4 applications have been employed for the planning of space and planetary exploration missions and the significance of such tools has been also reflected in the evolution of the web-based ESA Space Environment Information System (SPENVIS, www.spenvis.oma.be). SPENVIS has been providing interfaces to various Geant4-based tools that can be used for a number of...
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  2. 23. Collaborative Iterative Radiation Shielding Optimisation System – CIRSOS
    Dr Fan Lei (RadMod Research, On behalf of the CIRSOS team)
    11/04/2017, 16:05
    CIRSOS is an integrated modelling environment (IME) for radiation effects analysis in space mission developments. It provides a complete set of models and tools required for a mission radiation effects analysis at different phases of its developments from conception to operation. It was initially developed in support of the ESA Cosmic Version programme, the JUICE mission in particular. It will...
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  3. 18. From CAD geometries to Geant4 via CADMesh
    Mr Marco Pinto (LIP)
    11/04/2017, 16:30
    Space radiation detectors could be rather complex, due to their specific geometries and materials. In addition, the need of trustful physics analysis and/or accurate detector response simulation taking into account all sources of secondary particles resulting from the interaction of primary particles with the detector materials, drives the need of a detailed detector geometry...
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  4. 38. Modeling of Irradition Effects in sub-N7 CMOS Logic Devices Using Layout-Based Design
    Mr Oskar Baumgartner (Global TCAD Solutions GmbH)
    11/04/2017, 16:55
    Modern electronic systems can be disrupted or damaged by high energy particles. Radiation effects have become a critical reliability issue in nanometer-scaled logic devices, particularly for aviation applications or space environments, and now increasingly for safety critical ground-level applications such as transportation and medicine. In the industrial development process of such devices...
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