Speaker
Mr
Adrian Evans
(IROC Technologies)
Description
This presentation provides a snapshot of the AO8191 TRP activity which
involves the comprehensive radiative characterization of 6 components (4
SRAMs, 1 SoC and 1 FPGA) using heavy-ions, high- and low-energy protons and electrons.
The test setups and methodologies will be presented as well as initial
heavy-ion test results.
In one SRAM component, an unusual SEFI failure mode was identified and
was investigated in detail using the SPA laser at the CNES, Toulouse.
