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Invited Talk: Historical look at the Development of the Focused, Pulsed Laser for SEE Testing of Integrated Circuits

11 Sept 2024, 14:20
40m
Newton 2 (ESA-ESTEC)

Newton 2

ESA-ESTEC

Keplerlaan 1 NL-2200 AG Noordwijk The Netherlands

Speaker

Steve BUCHNER (NRL)

Description

SEE testing using a focused, pulsed laser has reached a level of maturity that the technique is now widely employed in many laboratories around the world to supplement and complement heavy-ion testing. This has led to the publication of a handbook on focused, pulsed SEE laser testing to help those with little experience in optics perform SEE testing successfully and to present a series of steps that could lead to the development of a Standard. At this point, it is appropriate to look back over the years and recall the many contributions by several research groups to the development of the technique.

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