Speaker
salma ACHAQ
(ONERA/IES)
Description
We present our single-event effects (SEE) laser testing method and results on a commercial programmable 7nm FinFET System-on-Chip (SoC) obtained using backside single-photon absorption (SPA).
Primary authors
salma ACHAQ
(ONERA/IES)
Vincent POUGET
(IES - CNRS)
Laurent ARTOLA
(ONERA)
Florent MANNI
(CNES (DSO/TB/ET))
Arnaud DUFOUR
(CNES)
Prof.
Jerome BOCH
(IES)
