Speaker
Thomas BOREL
(TEC-QEC)
Description
Over the past three years, the ESA TEC laboratory has been equipped with a SEE laser facility. During this period, we conducted a variety of tests and assessments on EEE components to evaluate their SEE sensitivity and identify design vulnerabilities. Additionally, we developed several tools to enhance data acquisition and analysis. In this presentation, we will showcase the results of different test cases performed using the SEE laser system.
Primary author
Thomas BOREL
(TEC-QEC)
