The use of pulsed laser for pre-screening COTS parts to SEEs, and more specifically to Single Event Latchup, is beneficial because of the reduced cost and greater availability this method provides, as compared to heavy ions. At TRAD, pulsed Laser is mainly used for this purpose: evaluating part sensitivities to SEEs, prior to heavy ion testing, in order to reject the most sensitive ones, thus...
In the field of single-event effects (SEE) testing, laser testing [1] is commonly used for different purposes. The most well-known application is probably the accurate mapping of SEE sensitive areas in a device, especially in the context of radiation-hardening of an integrated circuit (IC) design. Another application consists in screening different components against critical events like...
