RADLAS 2024 : 6th Workshop on Laser Testing of Radiation Effects on Components and Systems

Session

Session: Test Methodology for SEE Laser Testing

11 Sept 2024, 12:20

Newton 2 (ESA-ESTEC)

15. Pre-screening and classification of sensitivity of COTS parts to Single Event Latchup, based on Pulsed Laser testing

Samuel DUBOS (TRAD Tests & Radiations)

11/09/2024, 12:20

Test Methodology for SEE Laser Testing

Oral

The use of pulsed laser for pre-screening COTS parts to SEEs, and more specifically to Single Event Latchup, is beneficial because of the reduced cost and greater availability this method provides, as compared to heavy ions. At TRAD, pulsed Laser is mainly used for this purpose: evaluating part sensitivities to SEEs, prior to heavy ion testing, in order to reject the most sensitive ones, thus...

19. Comparison and Applications of Different Scanning Methods using an Industrial Laser System Dedicated to Single Event Effects Testing

Sebastien JONATHAS (PULSCAN)

11/09/2024, 12:40

Test Methodology for SEE Laser Testing

Oral

In the field of single-event effects (SEE) testing, laser testing [1] is commonly used for different purposes. The most well-known application is probably the accurate mapping of SEE sensitive areas in a device, especially in the context of radiation-hardening of an integrated circuit (IC) design. Another application consists in screening different components against critical events like...