Speaker
Dr
Pierre Garcia
(TRAD)
Description
The focus of our study is to evaluate the impact of single event effect on Kintex-7 SRAM based FPGA. The 28nm Kintex-7 family is optimized for best price-performance with 2X improvement compared to previous generation. One of the few major disadvantages of SRAM-based FPGAs is their sensitivity to ionizing radiation. A change in configuration memory due to radiation can modify the implemented circuit, possibly leading to Single Event Functional Interruptions, SEFI for example. Moreover, the improvement of the technological node, such as in kintex-7, can lead to the increase of the sensitivity to ionizing particles.
Two different approaches will be used in order to estimate the SEE sensitivity of the device, one design composed by shift register chain, and a second complex design dedicated to represent a typical space application. The aim of the first test vehicle being to characterize the different elements of the FPGA, it is proposed to test in the same time during irradiation under heavy ion beam, a group of chains and a block memory of 36 Kbits.
The second design will be an actual space application. This test vehicle must present an interest for spacecraft payload or platform. However the diagnostic of the failures linked to soft errors must be easy to interpret. On the other hand it also must present a sufficient complexity to necessitate a Kintex-7 FPGA.
During the presentation, this two vehicle designs and the test bench will be described and explained. Details of the kintex-7 implementation for SEE testing will also be discussed.
Primary author
Dr
Pierre Garcia
(TRAD)
