13th Geant4 Space Users Workshop

Terrestrial Neutron-Induced Single Event Burnout Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs

28 Nov 2018, 15:30

25m

Radiation effects and single event effects

Speakers

Robert Reed (Vanderbilt University) Robert Reed (ISDE/Vanderbilt University)

Presentation materials

SiC SEB.pdf