13th Geant4 Space Users Workshop

Terrestrial Neutron-Induced Single Event Burnout Cross-Sections and FIT Rates for High-Voltage SiC Power MOSFETs

Nov 28, 2018, 3:30 PM

25m

Radiation effects and single event effects

Speakers

Robert Reed (ISDE/Vanderbilt University) Robert Reed (Vanderbilt University)

Presentation materials

SiC SEB.pdf