Conveners
Session 3: Technology Studies
- Christian POIVEY (ESA)
Said Bounasser
(ESA)
29/06/2023, 11:55
SB
Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)
Arto Javanainen
(Jyväskylä University),
Bendy Tanios
(Alter)
29/06/2023, 14:00
CP
Laurent Artola
(ONERA),
Maximilien Glorieux
(IROC)
29/06/2023, 14:20
CP
Fernando Romero Madera
(Alter),
José Francisco LARGAESPADA GÓMEZ
(Alter)
29/06/2023, 14:40
CP
Christoph Tscherne
(Seibersdorf Laboratories),
Peter Beck
(Seibersdorf Laboratories)
29/06/2023, 15:00
MPo
Marta Bagatin
(DEI - University of Padova),
Simone Gerardin
(DEI - University of Padova)
29/06/2023, 15:20
MPo
Aminata Carvalho
(Airbus DS),
Christian Binois
(Airbus DS),
Sébastien Morand
(Airbus DS)
CP
Presentation of heavy ion test results on SiC MOSFET and diodes for RHA guidelines on SiC devices