TEC-QEC Final Presentation days

Europe/Amsterdam
ESTEC (ESA )

ESTEC

ESA

Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
Description

TEC-QEC

Final Presentation Day

 


Radiation Hardness Assurance & Component Analysis Section (TEC-QEC) Final Presentation days

TEC-QEC Final Presentation Days will take place from on the 28-30 June 2023 at ESTEC.

During the event the major R&D activities and studies coordinated by TEC-QEC concluded between 2019 and 2022 will be presented .
 


Registration is required to access the venue. (No participation fee)

Registration
Participation to TEC-QEC Final Presentation days
TEC-QEC
    • Welcome & Introduction
    • Session 1: Facilities and Test Methods
      • 1
        Integreated SEE approach for SEE robust design ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands

        Comparison between Board level and component level testing (OSIP )

        Speaker: Cesar Pablo Fernandez (Sener)
      • 2
        SEE testing with laser beam, guidelines
        Speaker: Vincent Pouget (IES / CNRS)
      • 3
        Adoption of SEE laser testing as part of the RHA process for COTS screening and validation ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
        Speakers: Sébastien Morand (Airbus DS), Renaud Mangeret (Airbus DS), Jérémy Guillermin (TRAD), Samuel Dubos (TRAD)
      • 4
        Board level testing ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
        Speakers: Guillaume Montay (Sodern), Matthieu Beaumel (Sodern)
      • 4:00 PM
        Coffee Break ESTEC (ESA )

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
      • 5
        RADEF - Facility activities overview and updates ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
        Speaker: Heikki Kettunen (University of Jyväskylä, Department of Physics)
      • 6
        UCL - Facility activities overview and updates ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
        Speakers: Nancy Postiau (Université catholique de Louvain), Laurent Standaert (Université catholique de Louvain)
      • 7
        PSI - Facility activities overview and updates ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
        Speaker: Wojtek Hadjas (PSI)
      • 8
        CHIMERA - Facility activities overview and updates ESTEC

        ESTEC

        ESA

        Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
        Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN), Ruben Garcia Alia (CERN)
    • Lab Visit : Materials and EEE compomnent (Optionnal)
    • Welcome & Introduction
    • Session 2: In flight Data and Mission specific testing
      • 9
        Radiation testing of memories for the JUICE mission

        TID and SEE test several types of LPDDR3, NAND flash, and NOR flash memories

        Speakers: Bendy Tanios (Alter), Frederic Tilhac (Alter)
      • 10
        Publications - BepiColombo Radiation Monitor
        Speaker: Marco Pinto (ESA)
      • 11
        In-Orbit results from Celesta
        Speakers: Ruben Garcia Alia (CERN), Andrea Coronetti (CERN), Raffaello Secondo (CERN)
      • 10:40 AM
        Coffee Break
      • 12
        Radiation-induced SEL in a COTS SRAM memory - Test and Flight data

        Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results

        Speakers: André Martins Pio De Mattos (LIRMM), Douglas Almeida dos Santos (LIRMM), Luigi Dilillo (LIRMM)
      • 13
        Part 1: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission
        Speaker: Alexandre Rousset (TRAD)
      • 14
        Part 2: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission
        Speaker: Maximilien Glorieux (IROC)
    • Session 3: Technology Studies
      • 15
        Lessons Learned for Stuckt bit testing

        Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)

        Speaker: Said Bounasser (ESA)
      • 16
        SEE of SiC devices and analysis for radiation hardness assurance

        Presentation of heavy ion test results on SiC MOSFET and diodes for RHA guidelines on SiC devices

        Speakers: Aminata Carvalho (Airbus DS), Christian Binois (Airbus DS), Sébastien Morand (Airbus DS)
      • 12:40 PM
        Lunch Break
      • 17
        Part 1: Estimation of proton induced single event rate in very deep submicron technologies
        Speakers: Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)
      • 18
        Part 2: Estimation of proton induced single event rate in very deep submicron technologies
        Speakers: Laurent Artola (ONERA), Maximilien Glorieux (IROC)
      • 19
        MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization
        Speakers: Fernando Romero (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)
      • 20
        Part 1: Radiation screening of COTS components and verification of COTS RHA approach
        Speakers: Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)
      • 21
        Part 2: Radiation screening of COTS components and verification of COTS RHA approach
        Speakers: Peter Beck (Seibersdorf Laboratories), Christoph Tscherne (Seibersdorf Laboratories)
      • 3:35 PM
        Coffee Break
    • Session 4: Radiation Test Results
      • 22
        RACOCO
        Speakers: Jochen Kuhnhenn (Fraunhofer), Michael Steffens (Fraunhofer), Stefan Hoeffgen (Fraunhofer)
      • 23
        Test Results on SDRAM IS42S86400B-7TLI

        Laser test results of the IS42S86400B-7TLI to explain the different SEFI mechanisms

        Speaker: Maximilien Glorieux (IROC)
    • Annex Session
      • 24
        Introduction: Master RADMEP
        Speaker: Paul Leroux (KU Leuven)
    • Lab Visit : Materials and EEE compomnent (Optionnal)
    • Welcome & Introduction
    • Session 4: Radiation Test Results
      • 25
        TID testing of statistically large quantitites of COTS parts

        TID test results on a large quantity of a COTS LM239 voltage comparator from 2 different vendors

        Speaker: Richard Sharp (Radtest Ltd)
      • 26
        Heavy Ion SEE Testing of Microsemi RTG4 flash based FPGA

        SEE of a two LEON FT core processor design in RTG4 FPGA

        Speaker: Richard Sharp (Radtest Ltd)
      • 27
        SEE tests on power Schottky Diodes
        Speaker: Alexandre Rousset (TRAD)
      • 10:30 AM
        Coffee Break
      • 28
        Heavy ion failure rate computation based on sensitive volume characterization in GaN/AlGaN FETs
        Speaker: Sébastien Morand (Airbus Defence and Space)
      • 29
        Radiation characterisation of EEE components for ESA space applications

        TID and SEE test results on COTS

        Speakers: Jens Lundell (Beyond Gravity), Keijo Nystrom (Beyond Gravity), Pasi Taipalus (Beyond Gravity)
      • 30
        Evaluation of Spin transfer torque DDR MRAM in Space environmenrt
        Speakers: Anthony Berne (Thales Alenia Space), Ronan Marec (Thales Alenia Space)
    • Lab Visit : Materials and EEE compomnent (Optionnal)