TEC-QEC Final Presentation days

Jun 28, 2023, 9:30 AM → Jun 30, 2023, 6:00 PM Europe/Amsterdam

ESTEC (ESA )

TEC-QEC

Final Presentation Day

 

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Radiation Hardness Assurance & Component Analysis Section (TEC-QEC) Final Presentation days

TEC-QEC Final Presentation Days will take place from on the 28-30 June 2023 at ESTEC.

During the event the major R&D activities and studies coordinated by TEC-QEC concluded between 2019 and 2022 will be presented .
 

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Registration is required to access the venue. (No participation fee)

Wednesday, June 28

Welcome & Introduction

Session 1: Facilities and Test Methods

1 Integreated SEE approach for SEE robust design

Comparison between Board level and component level testing (OSIP )

Speaker: Cesar Pablo Fernandez (Sener)

2 SEE testing with laser beam, guidelines

Speaker: Vincent Pouget (IES / CNRS)

3 Adoption of SEE laser testing as part of the RHA process for COTS screening and validation

Speakers: Sébastien Morand (Airbus DS), Renaud Mangeret (Airbus DS), Jérémy Guillermin (TRAD), Samuel Dubos (TRAD)

4 Board level testing

Speakers: Guillaume Montay (Sodern), Matthieu Beaumel (Sodern)

4:00 PM Coffee Break

5 RADEF - Facility activities overview and updates

Speaker: Heikki Kettunen (University of Jyväskylä, Department of Physics)

6 UCL - Facility activities overview and updates

Speakers: Nancy Postiau (Université catholique de Louvain), Laurent Standaert (Université catholique de Louvain)

7 PSI - Facility activities overview and updates

Speaker: Wojtek Hadjas (PSI)

8 CHIMERA - Facility activities overview and updates

Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN), Ruben Garcia Alia (CERN)

Lab Visit : Materials and EEE compomnent (Optionnal)

Thursday, June 29

Welcome & Introduction

Session 2: In flight Data and Mission specific testing

9 Radiation testing of memories for the JUICE mission

TID and SEE test several types of LPDDR3, NAND flash, and NOR flash memories

Speakers: Bendy Tanios (Alter), Frederic Tilhac (Alter)

10 Publications - BepiColombo Radiation Monitor

Speaker: Marco Pinto (ESA)

11 In-Orbit results from Celesta

Speakers: Ruben Garcia Alia (CERN), Andrea Coronetti (CERN), Raffaello Secondo (CERN)

10:40 AM Coffee Break

12 Radiation-induced SEL in a COTS SRAM memory - Test and Flight data

Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results

Speakers: André Martins Pio De Mattos (LIRMM), Douglas Almeida dos Santos (LIRMM), Luigi Dilillo (LIRMM)

13 Part 1: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission

Speaker: Alexandre Rousset (TRAD)

14 Part 2: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission

Speaker: Maximilien Glorieux (IROC)

Session 3: Technology Studies

15 Lessons Learned for Stuckt bit testing

Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)

Speaker: Said Bounasser (ESA)

16 SEE of SiC devices and analysis for radiation hardness assurance

Presentation of heavy ion test results on SiC MOSFET and diodes for RHA guidelines on SiC devices

Speakers: Aminata Carvalho (Airbus DS), Christian Binois (Airbus DS), Sébastien Morand (Airbus DS)

12:40 PM Lunch Break

17 Part 1: Estimation of proton induced single event rate in very deep submicron technologies

Speakers: Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)

18 Part 2: Estimation of proton induced single event rate in very deep submicron technologies

Speakers: Laurent Artola (ONERA), Maximilien Glorieux (IROC)

19 MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization

Speakers: Fernando Romero (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)

20 Part 1: Radiation screening of COTS components and verification of COTS RHA approach

Speakers: Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)

21 Part 2: Radiation screening of COTS components and verification of COTS RHA approach

Speakers: Peter Beck (Seibersdorf Laboratories), Christoph Tscherne (Seibersdorf Laboratories)

3:35 PM Coffee Break

Session 4: Radiation Test Results

22 RACOCO

Speakers: Jochen Kuhnhenn (Fraunhofer), Michael Steffens (Fraunhofer), Stefan Hoeffgen (Fraunhofer)

23 Test Results on SDRAM IS42S86400B-7TLI

Laser test results of the IS42S86400B-7TLI to explain the different SEFI mechanisms

Speaker: Maximilien Glorieux (IROC)

Annex Session

24 Introduction: Master RADMEP

Speaker: Paul Leroux (KU Leuven)

Lab Visit : Materials and EEE compomnent (Optionnal)

Friday, June 30

Welcome & Introduction

Session 4: Radiation Test Results

25 TID testing of statistically large quantitites of COTS parts

TID test results on a large quantity of a COTS LM239 voltage comparator from 2 different vendors

Speaker: Richard Sharp (Radtest Ltd)

26 Heavy Ion SEE Testing of Microsemi RTG4 flash based FPGA

SEE of a two LEON FT core processor design in RTG4 FPGA

Speaker: Richard Sharp (Radtest Ltd)

27 SEE tests on power Schottky Diodes

Speaker: Alexandre Rousset (TRAD)

10:30 AM Coffee Break

28 Heavy ion failure rate computation based on sensitive volume characterization in GaN/AlGaN FETs

Speaker: Sébastien Morand (Airbus Defence and Space)

29 Radiation characterisation of EEE components for ESA space applications

TID and SEE test results on COTS

Speakers: Jens Lundell (Beyond Gravity), Keijo Nystrom (Beyond Gravity), Pasi Taipalus (Beyond Gravity)

30 Evaluation of Spin transfer torque DDR MRAM in Space environmenrt

Speakers: Anthony Berne (Thales Alenia Space), Ronan Marec (Thales Alenia Space)

Lab Visit : Materials and EEE compomnent (Optionnal)