TEC-QEC Final Presentation days
ESTEC - Tennis Hall
ESA
TEC-QEC
Final Presentation Day
Radiation Hardness Assurance & Component Analysis Section (TEC-QEC) Final Presentation days
TEC-QEC Final Presentation Days will take place from on the 28-30 June 2023 at ESTEC.
During the event the major R&D activities and studies coordinated by TEC-QEC concluded between 2019 and 2022 will be presented .
Registration is required for external visitors to access the venue. (No participation fee)
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Welcome & IntroductionConvener: Christian POIVEY (ESA)
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Session 1: Facilities and Test MethodsConvener: Alessandra Costantino (ESA)
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1
Integreted approach for SEE robust design ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsComparison between Board level and component level testing (OSIP )
Speaker: Cesar Pablo Fernandez (Sener) -
2
SEE testing with laser beam, guidelinesSpeaker: Vincent POUGET (IES - CNRS)
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3
Adoption of SEE laser testing as part of the RHA process for COTS screening and validation ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsSpeakers: Sébastien Morand (Airbus DS), Renaud Mangeret (Airbus DS), Jérémy Guillermin (TRAD), Samuel Dubos (TRAD) -
4
Board level testing ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsSpeakers: Guillaume Montay (Sodern), Matthieu Beaumel (Sodern) -
15:50
Coffee Break ESTEC - Tennis Hall (ESA )
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands -
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RADEF - Facility activities overview and updates ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsSpeaker: Heikki Kettunen (University of Jyväskylä, Department of Physics) -
6
UCL - Facility activities overview and updates ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsSpeakers: Nancy Postiau (Université catholique de Louvain), Laurent Standaert (Université catholique de Louvain) -
7
PSI - Facility activities overview and updates ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsSpeaker: Wojtek Hadjas (PSI) -
8
CHIMERA - Facility activities overview and updates ESTEC - Tennis Hall
ESTEC - Tennis Hall
ESA
Keplerlaan 1, 2201 AZ Noordwijk, The NetherlandsSpeakers: Andrea Coronetti (CERN), Andreas Waets (CERN), Ruben Garcia Alia (CERN)
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1
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Lab Visit : Materials and EEE component (Optional)
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Welcome & Introduction
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Session 2: In flight Data and Mission specific testingConvener: Marc Poizat (ESA)
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10
In-Orbit results from CelestaSpeakers: Andrea Coronetti (CERN), Andreas Waets (CERN/ESA/UZH), Raffaello Secondo (CERN), Ruben Garcia Alia (CERN)
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10:35
Coffee Break
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11
Radiation-induced SEL in a COTS SRAM memory - Test and Flight data
Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results
Speakers: André Martins Pio De Mattos (LIRMM), Douglas Almeida dos Santos (LIRMM), Luigi Dilillo (LIRMM) -
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Part 1: Risk Assessment of SEE Events due to High Energy Electrons during the Juice MissionSpeakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)
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13
Part 2: Risk Assessment of SEE Events due to High Energy Electrons during the Juice MissionSpeaker: Maximilien Glorieux (IROC)
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Session 3: Technology StudiesConvener: Christian POIVEY (ESA)
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14
Lessons learned for SDRAM testing
Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)
Speaker: Said Bounasser (ESA) -
12:20
Lunch Break
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15
Part 1: Estimation of proton induced single event rate in very deep submicron technologiesSpeakers: Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)
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16
Part 2: Estimation of proton induced single event rate in very deep submicron technologiesSpeakers: Laurent Artola (ONERA), Maximilien Glorieux (IROC)
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17
MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterizationSpeakers: Fernando Romero Madera (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)
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18
Part 1: Radiation screening of COTS components and verification of COTS RHA approachSpeakers: Christoph Tscherne (Seibersdorf Laboratories), Peter Beck (Seibersdorf Laboratories)
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19
Part 2: Radiation screening of COTS components and verification of COTS RHA approachSpeakers: Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)
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15:40
Coffee Break
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14
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Session 4: Radiation Test ResultsConvener: Viyas Gupta (ESA)
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20
RACOCOSpeakers: Jochen Kuhnhenn (Fraunhofer), Michael Steffens (Fraunhofer), Stefan Hoeffgen (Fraunhofer)
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21
Test Results on SDRAM IS42S86400B-7TLI
Laser test results of the IS42S86400B-7TLI to explain the different SEFI mechanisms
Speaker: Maximilien Glorieux (IROC)
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20
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Annex Session
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Cocktail
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Lab Visit : Materials and EEE component (Optional)
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Welcome & IntroductionConvener: Viyas Gupta (ESA)
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Session 4: Radiation Test Results
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23
TID testing of statistically large quantitites of COTS parts
TID test results on a large quantity of a COTS LM239 voltage comparator from 2 different vendors
Speaker: Richard Sharp (Radtest Ltd) -
24
SEE tests on power Schottky DiodesSpeakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)
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10:10
Coffee Break
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25
Heavy Ion SEE Testing of Microsemi RTG4 flash based FPGA
SEE of a two LEON FT core processor design in RTG4 FPGA
Speaker: Richard Sharp (Radtest Ltd) -
26
Heavy ion failure rate computation based on sensitive volume characterization in GaN/AlGaN FETsSpeaker: Sébastien Morand (Airbus Defence and Space)
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23
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Lab Visit : Materials and EEE component (Optional)
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