TEC-QEC Final Presentation days

Name: TEC-QEC Final Presentation days
Start: 2023-06-28T09:30:00+02:00
End: 2023-06-30T18:00:00+02:00
Location: ESA

28 Jun 2023, 09:30 → 30 Jun 2023, 18:00 Europe/Amsterdam

ESTEC - Tennis Hall (ESA )

ESTEC - Tennis Hall

ESA

Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands

Description

TEC-QEC

Final Presentation Day

Radiation Hardness Assurance & Component Analysis Section (TEC-QEC) Final Presentation days

TEC-QEC Final Presentation Days will take place from on the 28-30 June 2023 at ESTEC.

During the event the major R&D activities and studies coordinated by TEC-QEC concluded between 2019 and 2022 will be presented .

Registration is required for external visitors to access the venue. (No participation fee)

TEC-QEC

ESArad@esa.int

Wednesday, 28 June
- 14:00 → 14:15
  
  Welcome & Introduction
  
  Convener: Christian POIVEY (ESA)
- 14:15 → 17:50
  Session 1: Facilities and Test Methods
  
  Convener: Alessandra Costantino (ESA)
  - 14:15
    
    Integreted approach for SEE robust design 20m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Comparison between Board level and component level testing (OSIP )
    
    Speaker: Cesar Pablo Fernandez (Sener)
    
    Integrated approach for SEE Robust Design_CesarPabloFernandez.pptx
  - 14:35
    
    SEE testing with laser beam, guidelines 30m
    
    Speaker: Vincent POUGET (IES - CNRS)
    
    3.2023-06-28 ESA TEC-QEC - Pouget.pdf
    
    Single-Event Effects Testing with a Laser Beam - Guidelines.pdf
  - 15:05
    
    Adoption of SEE laser testing as part of the RHA process for COTS screening and validation 25m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Speakers: Sébastien Morand (Airbus DS), Renaud Mangeret (Airbus DS), Jérémy Guillermin (TRAD), Samuel Dubos (TRAD)
    
    fpd_itt_rha_cots_laser_rc1.2.pptx
  - 15:30
    
    Board level testing 20m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Speakers: Guillaume Montay (Sodern), Matthieu Beaumel (Sodern)
    
    1_4_2023.06.28_ESAfpd_BoardLevelTesting_Sodern5.pptx
  - 15:50
    
    Coffee Break 15m ESTEC - Tennis Hall (ESA )
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
  - 16:05
    
    RADEF - Facility activities overview and updates 20m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Speaker: Heikki Kettunen (University of Jyväskylä, Department of Physics)
    
    20230628 RADEF.pptx
  - 16:25
    
    UCL - Facility activities overview and updates 20m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Speakers: Nancy Postiau (Université catholique de Louvain), Laurent Standaert (Université catholique de Louvain)
    
    Présentation_CRC.pdf
  - 16:45
    
    PSI - Facility activities overview and updates 20m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Speaker: Wojtek Hadjas (PSI)
    
    8.PIF_ESA_FPD_28.06.2023_v1.0.pdf
  - 17:05
    
    CHIMERA - Facility activities overview and updates 30m ESTEC - Tennis Hall
    
    ESTEC - Tennis Hall
    
    ESA
    
    Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands
    
    Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN), Ruben Garcia Alia (CERN)
    
    9.TEC_QEC_FP_AW_2_Chimera.pdf
- 18:00 → 19:00
  
  Lab Visit : Materials and EEE component (Optional)
Thursday, 29 June
- 09:40 → 09:55
  
  Welcome & Introduction
- 09:55 → 11:55
  Session 2: In flight Data and Mission specific testing
  
  Convener: Marc Poizat (ESA)
  - 09:55
    
    BepiColombo Radiation Monitor 20m
    
    Speaker: Marco Pinto (ESA)
    
    TEC-QEC-FPD.pptx
  - 10:15
    
    In-Orbit results from Celesta 20m
    
    Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN/ESA/UZH), Raffaello Secondo (CERN), Ruben Garcia Alia (CERN)
    
    2.In-orbit results from CELESTA.pptx
  - 10:35
    
    Coffee Break 20m
  - 10:55
    
    Radiation-induced SEL in a COTS SRAM memory - Test and Flight data 20m
    
    Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results
    
    Speakers: André Martins Pio De Mattos (LIRMM), Douglas Almeida dos Santos (LIRMM), Luigi Dilillo (LIRMM)
    
    3.Radiation-Induced SEL in COTS SRAM Memory.pdf
  - 11:15
    
    Part 1: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission 20m
    
    Speakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)
    
    4.Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission.pdf
  - 11:35
    
    Part 2: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission 20m
    
    Speaker: Maximilien Glorieux (IROC)
    
    AO8191_20230629_TEC-QEC_v1.pdf
- 11:55 → 16:15
  Session 3: Technology Studies
  
  Convener: Christian POIVEY (ESA)
  - 11:55
    
    Lessons learned for SDRAM testing 25m
    
    Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)
    
    Speaker: Said Bounasser (ESA)
    
    6.SB_QEC_FinalPresentation.pdf
    
    6.SB_QEC_FinalPresentation.pptx
  - 12:20
    
    Lunch Break 1h 40m
  - 14:00
    
    Part 1: Estimation of proton induced single event rate in very deep submicron technologies 20m
    
    Speakers: Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)
    
    Part 1 - Estimation of proton induced single event rate in very deep submicron technologies.pdf
  - 14:20
    
    Part 2: Estimation of proton induced single event rate in very deep submicron technologies 20m
    
    Speakers: Laurent Artola (ONERA), Maximilien Glorieux (IROC)
    
    Estimation of Proton induced Single-Event rate in very-deep_v2.pdf
  - 14:40
    
    MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization 20m
    
    Speakers: Fernando Romero Madera (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)
    
    MOSFET commercial plastic components survey and its SEE behaviour_v3.pptx
  - 15:00
    
    Part 1: Radiation screening of COTS components and verification of COTS RHA approach 20m
    
    Speakers: Christoph Tscherne (Seibersdorf Laboratories), Peter Beck (Seibersdorf Laboratories)
    
    Tscherne_CORHA_ESA_FPD_v1.0.pdf
  - 15:20
    
    Part 2: Radiation screening of COTS components and verification of COTS RHA approach 20m
    
    Speakers: Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)
    
    CORHA Part 2 - Radiation screening of COTS components and verification of COTS RHA approach.pdf
  - 15:40
    
    Coffee Break 30m
- 16:10 → 16:50
  Session 4: Radiation Test Results
  
  Convener: Viyas Gupta (ESA)
  - 16:10
    
    RACOCO 20m
    
    Speakers: Jochen Kuhnhenn (Fraunhofer), Michael Steffens (Fraunhofer), Stefan Hoeffgen (Fraunhofer)
    
    13.Fraunhofer_RACOCO_FinalPresentationDays_2023-06-29_v1.0.pdf
  - 16:30
    
    Test Results on SDRAM IS42S86400B-7TLI 20m
    
    Laser test results of the IS42S86400B-7TLI to explain the different SEFI mechanisms
    
    Speaker: Maximilien Glorieux (IROC)
    
    Test Results on SDRAM IS42S86400B-7TLI.pdf
- 16:50 → 17:10
  Annex Session
  - 16:50
    
    Introduction: Master RADMEP 20m
    
    Speaker: Paul Leroux (KU Leuven)
    
    15.EMJMD RADMEP - ESA -2023.pptx
- 17:30 → 19:00
  
  Cocktail
- 18:30 → 19:30
  
  Lab Visit : Materials and EEE component (Optional)
Friday, 30 June
- 09:15 → 09:30
  
  Welcome & Introduction
  
  Convener: Viyas Gupta (ESA)
- 09:30 → 12:00
  Session 4: Radiation Test Results
  - 09:30
    
    TID testing of statistically large quantitites of COTS parts 20m
    
    TID test results on a large quantity of a COTS LM239 voltage comparator from 2 different vendors
    
    Speaker: Richard Sharp (Radtest Ltd)
    
    Sharp - TID testing of statistically.pptx
  - 09:50
    
    SEE tests on power Schottky Diodes 20m
    
    Speakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)
    
    SEE tests on power Schottky Diodes.pdf
  - 10:10
    
    Coffee Break 30m
  - 10:40
    
    Heavy Ion SEE Testing of Microsemi RTG4 flash based FPGA 20m
    
    SEE of a two LEON FT core processor design in RTG4 FPGA
    
    Speaker: Richard Sharp (Radtest Ltd)
    
    3.Sharp - RTG4.pptx
  - 11:00
    
    Heavy ion failure rate computation based on sensitive volume characterization in GaN/AlGaN FETs 20m
    
    Speaker: Sébastien Morand (Airbus Defence and Space)
    
    fpd_osip_GaN_rev4.pdf
- 13:00 → 14:00
  
  Lab Visit : Materials and EEE component (Optional)