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TEC-QEC Final Presentation days

28–30 Jun 2023
ESA
Europe/Amsterdam timezone

TEC-QEC

Session

Session 3: Technology Studies

29 Jun 2023, 11:55
ESTEC - Tennis Hall (ESA )

ESTEC - Tennis Hall

ESA

Keplerlaan 1, 2201 AZ Noordwijk, The Netherlands

Conveners

Session 3: Technology Studies

  • Christian POIVEY (ESA)

Presentation materials

There are no materials yet.

  1. 1. Lessons learned for SDRAM testing
    Said Bounasser (ESA)
    29/06/2023, 11:55
    SB

    Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)

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  2. 35. Part 1: Estimation of proton induced single event rate in very deep submicron technologies
    Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)
    29/06/2023, 14:00
    CP
  3. 8. Part 2: Estimation of proton induced single event rate in very deep submicron technologies
    Laurent Artola (ONERA), Maximilien Glorieux (IROC)
    29/06/2023, 14:20
    CP
  4. 38. MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization
    Fernando Romero Madera (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)
    29/06/2023, 14:40
    CP
  5. 13. Part 1: Radiation screening of COTS components and verification of COTS RHA approach
    Christoph Tscherne (Seibersdorf Laboratories), Peter Beck (Seibersdorf Laboratories)
    29/06/2023, 15:00
    MPo
  6. 37. Part 2: Radiation screening of COTS components and verification of COTS RHA approach
    Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)
    29/06/2023, 15:20
    MPo
  7. 2. SEE of SiC devices and analysis for radiation hardness assurance
    Aminata Carvalho (Airbus DS), Christian Binois (Airbus DS), Sébastien Morand (Airbus DS)
    CP

    Presentation of heavy ion test results on SiC MOSFET and diodes for RHA guidelines on SiC devices

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