TEC-QEC Final Presentation days

Session

Session 3: Technology Studies

29 Jun 2023, 11:55

ESTEC - Tennis Hall (ESA )

Conveners

Session 3: Technology Studies

• Christian POIVEY (ESA)

1. Lessons learned for SDRAM testing

Said Bounasser (ESA)

29/06/2023, 11:55

SB

Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)

35. Part 1: Estimation of proton induced single event rate in very deep submicron technologies

Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)

29/06/2023, 14:00

CP

8. Part 2: Estimation of proton induced single event rate in very deep submicron technologies

Laurent Artola (ONERA), Maximilien Glorieux (IROC)

29/06/2023, 14:20

CP

38. MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization

Fernando Romero Madera (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)

29/06/2023, 14:40

CP

13. Part 1: Radiation screening of COTS components and verification of COTS RHA approach

Christoph Tscherne (Seibersdorf Laboratories), Peter Beck (Seibersdorf Laboratories)

29/06/2023, 15:00

MPo

37. Part 2: Radiation screening of COTS components and verification of COTS RHA approach

Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)

29/06/2023, 15:20

MPo

2. SEE of SiC devices and analysis for radiation hardness assurance

Aminata Carvalho (Airbus DS), Christian Binois (Airbus DS), Sébastien Morand (Airbus DS)

CP

Presentation of heavy ion test results on SiC MOSFET and diodes for RHA guidelines on SiC devices