Speaker
Melanie Berg
(Space R2 LLC)
Description
For space systems, radiation particles can cause faults in microelectronics that inhibit operation and hence reduce system reliability. In turn, radiation hardness assurance methods have been developed to predict component susceptibility and perform system failure analyses. These practices have been applied for decades and are now in need of being modernized for better characterization of today’s complex system applications. This presentation describes what is required to test and analyze complex components such as SoC and FPGA devices, how conventional methods are insufficient, and how new methods can provide optimal coverage for failure analyses.
Primary author
Melanie Berg
(Space R2 LLC)
