RADLAS 2024 : 6th Workshop on Laser Testing of Radiation Effects on Components and Systems

Exploration of the Single Event Effect Sensitivity of a 16nm FinFET System-on-Chip using Single-Photon Absorption Laser Testing

11 Sept 2024, 10:30

20m

Newton 2 (ESA-ESTEC)

Oral Recent Laser test results Session: Recent Laser test results

Speaker

Mr Matthieu FONGRAL (IES)

Description

We present Single Event Effect (SEE) testing method and results in a complex System-on-Chip (SoC) fabricated with a 16nm FinFET technology using backside Single Photon Absorption (SPA) laser testing, including Single Event Latchup (SEL), Single Event Transient (SET) and Single Event Upset (SEU) results.

Presentation materials

RADLAS2024_Fongral_presentation.pdf