IES - CNRS
Author in the following contributions
- Exploration of the Single Event Effect Sensitivity of a 16nm FinFET System-on-Chip using Single-Photon Absorption Laser Testing
- Single-Event Effects Laser Testing of a 7nm FinFET System-on-Chip with AI-Acceleration Capabilities
- Laser SEE Testing of Commercial SRAMs and Correlation with Heavy Ion Data