16–18 Sept 2014
European Space Research and Technology Centre (ESTEC)
Europe/Amsterdam timezone
Note: all available presentations have been posted on the website

Single Event Upset Characterization of Commercial Grade SRAM and FLASH-based Field Programmable Gate Array Using Proton Irradiation

17 Sept 2014, 16:25
30m
Newton 2 (European Space Research and Technology Centre (ESTEC))

Newton 2

European Space Research and Technology Centre (ESTEC)

Keplerlaan 1 2201AZ Noordwijk ZH The Netherlands

Speaker

Tomáš Vaňát (Nuclear Physics Institute of the ASCR)

Description

ALICE experiment at LHC collider in CERN laboratory in Geneva is preparing the upgrade of inner tracking system based on ~25 . 10^9 silicon pixel sensors with envisaged number of data links reaching 1000. Due to expected large number of FPGAs, only commercial grade FPGA can be considered. FPGA should have the reliable performance up to the expected lifetime total ionization dose of 10 krad. These requirements call for dedicated FPGA selection procedure. The cyclotron in Nuclear Physics Institute in Rez near Prague with proton beam energies up to 35 MeV and broad range of beam intensities is used to measure SEU probability as a function of proton beam flux, dose, beam energy and FPGA clock frequency. Precise dosimetry is based on ionization chamber cross-calibrated with Medipix type device. The measurements will be used for setting up a calibrated fault injection model of a particular FPGA, which will be used for simulation of various designs foreseen for this FPGA without the need of testing them each individually in radiation environment.

Primary authors

Jan Pospíšil (Nuclear Physics Institute of the ASCR) Tomáš Vaňát (Nuclear Physics Institute of the ASCR)

Co-author

Jozef Ferencei (Nuclear Physics Institute of the ASCR)

Presentation materials