Speaker
Mr
Sergei Iakovlev
(Branch of JSC “URSC” - “ISDE”)
Description
This paper presents the results of heavy-ion induced single event effect (SEE) tests, performed on analog to digital converters (ADC), which are candidates for usage in spacecraft electronics. The experimental data was obtained at Roscosmos Test Facilities during test campaigns in 2017.
Summary
Analog to digital converters of COTS and industrial production-levels are widely used in the space industry. However, there is very few data on exposing these components to heavy ions. Before using these components in space, they must be tested. The most safety critical type of SEE for analog to digital converters is SEL, which, moreover, often leads to destructive failure.
Primary authors
Mr
Aleksandr Koziukov
(Branch of JSC “URSC” - “ISDE”)
Mr
Anton Bychkov
(Branch of JSC “URSC” - “ISDE”)
Mr
Sergei Iakovlev
(Branch of JSC “URSC” - “ISDE”)
