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AMICSA 2018

17–20 Jun 2018
Leuven, Belgium
Europe/Brussels timezone
On-site registration will be possible on Monday, June 18, 08:30 to 10:00

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Session

Radiation Effects

18 Jun 2018, 09:45
IMEC (Leuven, Belgium)

IMEC

Leuven, Belgium

Kapeldreef 75 3001 Heverlee Belgium

Conveners

Radiation Effects

  • Sebastian Millner (Tesat-Spacecom GmbH & Co. KG)

Description

Radiation Effects on analogue and mixed-signal ICs

Presentation materials

There are no materials yet.

  1. 17. Single Event Effects Analysis in ReadOut Integrated Circuits at Cryogenic Temperatures
    Mr Laurent Artola (ONERA)
    18/06/2018, 09:45
    Radiation Effects on analogue and mixed-signal ICs
    Oral
    **1. Introduction** CMOS technology is widely used in Image sensors and Infrared detector onboard spacecrafts [1]. Actually, many optical applications, like Earth or space observation, the guidance system in a spacecraft (launcher or satellite) are particularly critical. Photonic imager technology has been developed for various wavelengths from ultraviolet, through visible, to infrared. For...
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  2. 13. Static Linearity Test for Radiation Effects Characterization of an 18-bit SAR Serial IO COTS ADC: Analog Devices AD7982
    Dr Sonia Vargas-Sierra (Alter Technology)
    18/06/2018, 10:10
    Radiation tests of analogue and mixed-signal ICs
    Oral
    This paper reports the testing results of a SuccessiveApproximation-Register (SAR) ADC of 18-bits with Serial Input/Output digital interface. We compare the results of using a standard approach with a new test methodology for SAR static linearity testing. The available test time in between radiation steps is limited in order to avoid annealing. The presented method strongly reduces the...
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  3. 23. Validation of a High Resolution ADC for Space Applications
    Mr Kostas Makris (ISD S.A)
    18/06/2018, 10:35
    Radiation tests of analogue and mixed-signal ICs
    Poster
    We present the test results of a radiation hardened, high resolution ADC for space applications. The ADC is a low-noise, low sampling rate, radiation hardened device optimized to operate in a frequency range from DC to 40kHz. The ADC has been implemented in the 150nm CMOS-SOI process of Atmel following a rigorous design flow and radiation hardening strategy. The ADC features a fully...
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