12-16 November 2018
ESA/ESTEC
Europe/Amsterdam timezone

Single Event Effects (SEE): Mechanisms and Classifications

12 Nov 2018, 12:15
1h
Newton 1-2 (ESA/ESTEC)

Newton 1-2

ESA/ESTEC

Keplerlaan 1, 2200 AG Noordwijk The Netherlands

Speaker

Dr Stephen Buchner (United States Naval Research Laboratory)

Description

The fundamental mechanisms responsible for non-destructive and destructive
Single-Event Effects in ICs will be described in detail. This will include the
interactions of ions with the constituent materials of the IC, the response of
individual transistors to the disturbance, and the effect on the operation of the
IC. The evolution of the threat with device scaling will be addressed.

Presentation Materials