12-16 November 2018
ESA/ESTEC
Europe/Amsterdam timezone

14th international School on the Effects of Radiation on Embedded Systems for Space Applications

                  ESTEC Campus

This five-day school SERESSA combines academic, government, and industrial communities working in the area of radiation effects on embedded systems. Radiation effects are a significant concern for space and avionics systems, as well as for critical applications operating at ground level such as automotive, medical or even banking.

During these five days, lecturers with significant experience in key selected subjects will provide a complete state-of-the-art instruction in this strategic field. The school is based on lectures, exercises, and practical courses involving real case studies using the common tools of the domain.

The topics addressed cover the full spectrum of radiation effects on space-embedded systems: space environment, error mechanisms, testing, hardening by design, rate prediction. The intended audience includes both beginning and experienced researchers, engineers, and post-graduate students wishing to enhance their knowledge base in this rapidly evolving field. 

Topics

Topics covered by SERESSA include:

  • radiation environment
  • spacecraft anomalies
  • single-event effects (SEE)
  • total dose effects (TID)
  • radiation effects in power systems
  • radiation effects in solar cells
  • architecture hardening in analog and digital circuits and in memories
  • software hardening
  • effects in FPGAs
  • hardness assurance
  • rate prediction
  • radiation testing
  • laser testing 
  • remote testing experiments
Starts
Ends
Europe/Amsterdam
ESA/ESTEC
Newton 1-2
Keplerlaan 1, 2200 AG Noordwijk The Netherlands
00 - Introduction - Raoul Velazco
00 - Program - Gregoire Deprez
01 - Space Environments - Hugh Evans
02 - TID and TNID - Christian Poivey
03 - Single events effects mechanisms - Stephen Buchner
04 - SEE test methods - Konstantin Tapero
05 - SEE effects on VLSI devices - Luca Sterpone
06 - EEE parts New Space Paradigm - Ken LaBel
07 - Radiation Hardness Assurance - Stephen Buchner
08 - System Hardening and Real Applications - Michel Pignol
09 - High level modeling - Otmane Ait Mohamed
10 - Fault Injection Methodologies - Luis Entrena
11 - SEU rate prediction - Raoul Velazco
12 - ASIC FPGA Handbook - Agustin Fernandez-Leon
13 - FPGA Mitigation Strategies - Melanie Berg
14 - Hardened Cell Library - Joao Batista dos Santos
15 - Microprocessor Testing - Heather Quinn
16 - Many core processors fault tolerance - Ramos & Vargas
17 - Radiation tests SRAM memories - Juan Clemente
18 - Laser SEE testing - Dale McMorrow
19 - Automotive safety challenges - Sung Chung
20 - Error correction embedded memories - Fakhreddine Ghaffari
21 - Effects of radiations on solar cells - Jose Ramon-Gonzales
22 - Co60 training Presentation 2 - Jaime Estela
22 - Co60 training TID test execution - Michele Muschitiello & Alessandra Costantino
23 - Atmospheric Radiation - Frederic Wrobel
24 - CNES and COTS in Space - Michel Pignol
25 - COTS in space - Jaime Estela
26 - COTS on ground UHE radiation test - Ruben Garcia Alia
27 - ESA approach COTS - Karin Lundmark
28 - Conclusion - Velazco and Deprez
00 - Introduction - Velazco & Deprez
01 - Space environment - Hugh Evans
02 - TID and TNID - Christian Poivey
03 - Single events effects mechanisms - Stephen Buchner
04 - SEE test methods - Konstantin Tapero
05 - SEE effects on VLSI devices - Luca Sterpone
06 - EEE parts New Space Paradigm - Ken LaBel
07 - Radiation Hardness Assurance - Stephen Buchner
08 - System Hardening and Real Applications - Michel Pignol
09 - High Level Modeling and Validation of SEE - Otmane Ait Mohamed
10 - Fault Injection Methodologies - Luis Entrena
11 - SEU rate prediction - Raoul Velazco
12 - ASIC FPGA Handbook - Agustin Fernandez-Leon
13 - FPGA Mitigation Strategies - Melanie Berg
14 - Hardened Cell Library - Joao Batista dos Santos
15 - Microprocessor Testing - Heather Quinn
16 - Many core processors fault tolerance - Ramos & Vargas
17 - Radiation tests SRAM memories - Juan Clemente
18 - Laser SEE testing - Dale McMorrow
19 - Automotive safety challenges - Sung Chung
20 - Error correction embedded memories - Fakhreddine Ghaffari
21 - Effects of radiations on solar cells - Jose Ramon-Gonzales
23 - Atmospheric Radiation - Frederic Wrobel
24 - CNES and COTS in Space - Michel Pignol
25 - COTS in space - Jaime Estela
26 - COTS on ground UHE radiation test - Ruben Garcia Alia
27 - ESA approach COTS - Karin Lundmark
28 - Conclusion - Velazco & Deprez
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