SERESSA International School 12-16 Nov. 2018

Europe/Amsterdam
Newton 1-2 (ESA/ESTEC)

Newton 1-2

ESA/ESTEC

Keplerlaan 1, 2200 AG Noordwijk The Netherlands
Raoul Velazco (Université Grenoble-Alpes / TIMA), Veronique Ferlet-Cavrois (ESA), Gregoire Deprez (ESA), Jaime Estela (Spectrum ARC GmbH), Petteri Nieminen (ESA)
Description

14th international School on the Effects of Radiation on Embedded Systems for Space Applications

                  ESTEC Campus

This five-day school SERESSA combines academic, government, and industrial communities working in the area of radiation effects on embedded systems. Radiation effects are a significant concern for space and avionics systems, as well as for critical applications operating at ground level such as automotive, medical or even banking.

During these five days, lecturers with significant experience in key selected subjects will provide a complete state-of-the-art instruction in this strategic field. The school is based on lectures, exercises, and practical courses involving real case studies using the common tools of the domain.

The topics addressed cover the full spectrum of radiation effects on space-embedded systems: space environment, error mechanisms, testing, hardening by design, rate prediction. The intended audience includes both beginning and experienced researchers, engineers, and post-graduate students wishing to enhance their knowledge base in this rapidly evolving field. 

Topics

Topics covered by SERESSA include:

  • radiation environment
  • spacecraft anomalies
  • single-event effects (SEE)
  • total dose effects (TID)
  • radiation effects in power systems
  • radiation effects in solar cells
  • architecture hardening in analog and digital circuits and in memories
  • software hardening
  • effects in FPGAs
  • hardness assurance
  • rate prediction
  • radiation testing
  • laser testing 
  • remote testing experiments
Presentations
Participants
  • Alessandra Barco
  • Alessandra Ciapponi
  • Alessandra Costantino
  • Aneesh Balakrishnan
  • Anežka Kabátová
  • Ashwin Mangalore
  • Aurélie Cruau
  • Beatriz Sanchez Garcia
  • Benjamin TREUILLARD
  • Berta Hoyos
  • Bilel Belhadj
  • Cesar Boatella Polo
  • Christian M. Fuchs
  • Christoph Tscherne
  • Claudio Monteleone
  • Constantinos Papadimitriou
  • Damien PRÊLE
  • Daniel Söderström
  • Dave Geerardyn
  • David Geys
  • David Hellmann
  • David Levacq
  • David Lucsanyi
  • Denisa Dosenovicova
  • Dmytro Petryk
  • ERIC FONTENEAU
  • Fabrice Voisin
  • FARRUKH WAHEED
  • Felice Torelli
  • Floris Rouwen
  • Gilles LE MORVAN
  • Giovanni Santin
  • GIUSEPPE LA VACCA
  • Hendrik Neumann
  • Hélène BERNARD
  • Ida Klappevik
  • Irene Cerro Herrero
  • Ismail Feldkamp
  • Jan Broulim
  • Jan Zich
  • Jared Harvey
  • Jimenez Carreira Joaquin
  • Johan Leijtens
  • Jonathan Pellish
  • José Joaquin González Luján
  • Jouni Latti
  • Julian Spahr
  • Junchao Chen
  • Karl Emil Sandvik Bohne
  • Kay-Obbe Voss
  • Khaza Anuarul Hoque
  • Klemen Bravhar
  • Konstantinos Karavelas
  • Konstantinos Vasiliou
  • Kostas Marinis
  • Kozo Takeuchi
  • Kris Niederkleine
  • Kyle Lewis
  • Lars Hoffmann
  • Lucia Pigliaru
  • Ludovica Bozzoli
  • Lütfi Boyacı
  • Magali Haussy
  • Manfred Broda
  • Manuel Peña Fernández
  • Manuel Rivas
  • Marc Poizat
  • Marco Pinto
  • Marco Vuolo
  • Marko Andjelkovic
  • Matteo Cecchetto
  • Matěj Vaculčiak
  • Michael Holik
  • Mika Holmberg
  • Moysis Tsamsakizoglou
  • Neophytos Messios
  • Patrick Bihn
  • Patrick Schauer
  • Paul Gagern
  • Pavel Vancura
  • Pavlina Sedlackova
  • PEDRO JOSE JURADO LOZANO
  • Pedro Martín-Holgado
  • Petr Suchanek
  • Petr Svoboda
  • Philippe GARE
  • Robert Furnell
  • Rousslan Goulouev
  • Samantha Rason
  • Sascha Lüdeke
  • Sedki Amor
  • Si CHEN
  • silvia moranti
  • Stefan Gensing
  • Stefan Hoeffgen
  • Stefan Schmidt
  • Stefano Della Torre
  • SVEN LANDSTROEM
  • Sébastien VIGNE
  • Tiang Hong Cheng
  • TOMAS BENKA
  • Toncho Ivanov
  • Torgeir Paulsen
  • Torsten Köhne
  • Ulla Laitinen
  • Vadim Campbell
  • Véronique Ferlet-Cavrois
  • Yvan HUBERT
    • 09:00 11:00
    • 09:30 10:30
      Space and atmospheric environments Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 09:30
        Space Environments 1h

        This talk presents the various radiation environments encountered by any spacecraft wandering in space, from LEO to interplanetary. For each of these environments, the potentially harmful phenomena - mainly trapped radiation, galactic cosmic rays and solar particle events - are presented as well as their degrading effects on spacecraft electronic systems.

        Speaker: Mr Hugh Evans (ESA/TEC-EPS)
    • 11:00 17:00
      Radiation effects (SEE, TID, TNID) Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 11:00
        TID and TNID 1h 15m
        Speaker: Mr Christian POIVEY (ESA)
      • 12:15
        Single Event Effects (SEE): Mechanisms and Classifications 1h

        The fundamental mechanisms responsible for non-destructive and destructive
        Single-Event Effects in ICs will be described in detail. This will include the
        interactions of ions with the constituent materials of the IC, the response of
        individual transistors to the disturbance, and the effect on the operation of the
        IC. The evolution of the threat with device scaling will be addressed.

        Speaker: Dr Stephen Buchner (United States Naval Research Laboratory)
      • 14:30
        Single Event Effects Test Methods 1h

        The lecture presents an overview of main types of single event effects (SEE), basic characteristics of sensitivity of devices and integrated circuits to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including requirements for the energy of ions, their linear energy transfer (LET) and the range in semiconductor, recommendations for choosing the flux and fluency of ions, requirements for beam control during testing. Also, the lecture gives information about the specifics of testing for different types of SEE, such as: an impact of temperature and electrical bias conditions on the test results; recommendations for choosing test patterns during testing; advantages and disadvantages of static and dynamic testing; an impact of total ionizing dose effects on test results; specifics of testing for destructive types of SEEs and others. In addition, the lecture presents some recommendations for choosing the SEE test algorithms depending on the purpose and required result of testing.

        Speaker: Dr Konstantin Tapero
      • 16:00
        SEE effects on VLSI devices (ASIC and FPGA) 1h

        Radiation effects on VLSI technology are provoked when radiation particles such as neutrons, protons or heavy ions hit a sensitive region of the integrated circuits. Due to the progressive technology scaling, VLSI devices are becoming, more and more vulnerable to Single Event Effects (SEEs) and are subject to cumulative ionizing damage known as Total Ionization Dose (TID). This talk will firstly describe the state-of-the-art methodologies used for analysing the impact of radiation effects on modern FPGAs and ASICs by means of Computer Aided Design (CAD) tools and secondly, it will describe the state-of-the-art CAD design techniques for their mitigation.

        Speaker: Prof. Luca Sterpone (Politecnico di Torino)
    • 13:15 14:30
      Lunch 1h 15m Restaurant/Lunchpad/ESCAPE

      Restaurant/Lunchpad/ESCAPE

      ESA/ESTEC

    • 15:30 16:00
      Coffee and posters 30m Foyer

      Foyer

      ESA/ESTEC

    • 17:00 18:00
      Mitigation and Hardening Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 17:00
        EEE Parts in the New Space Paradigm 1h

        As the space business rapidly evolves to accommodate a lower cost model of development and operation via concepts such as commercial space and small spacecraft (aka, CubeSats and swarms), traditional EEE parts screening and qualification methods are being scrutinized under a risk reward trade space. In this presentation, two basic concepts will be discussed: The movement from complete risk aversion EEE parts methods to managing and/or accepting risk
        via alternate approaches; and discussion of emerging assurance methods to reduce overdesign as well emerging model based mission assurance (MBMA) concepts. Example scenarios will be described as well as consideration for trading traditional versus alternate methods.

        Speaker: Mr Kenneth LaBel (NASA-GSFC)
    • 18:00 18:30
      End of the day discussions 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:00 09:30
      Registration 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:30 13:00
      Mitigation and Hardening Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 09:30
        Radiation Effects Hardness Assurance for space mission 1h

        The approach used to ensure that parts will meet performance requirements for a mission operating in a radiation environment will be discussed. First part
        will mostly focus on Single Event Effect Hardness Assurance. A particular mission will be used to illustrate the method. Second part will develop total ionizing dose (TID) and displacement damage (DD) hardness assurance.
        Rationale for defining Radiation Design Margin (RDM) requirements will be presented. Systematic errors and uncertainties on the different inputs needed to define the TID and DD RDM will be discussed.

        Speaker: Dr Stephen Buchner (United States Naval Research Laboratory)
      • 11:00
        System Hardening and Real Applications 2h

        This talk describes the suitable protections at architecture and system level against the effects of radiation on electronic components and digital systems. After the description of the general architecture of a space avionics system, the potential solutions for each type of units constituting an on-board computer are presented through the example of real space applications: avionics bus, links, memory units, and – the main part – processing units i.e. fault-tolerant architectures. The main fault-tolerant mechanisms are overviewed, as time replication either at instruction or task level, duplex, triplex (TMR), lock-step, and a trade-off between these different solutions. Then, real case studies are analyzed.

        Speaker: Mr Michel Pignol (CNES)
    • 10:30 11:00
      Coffee and posters 30m Foyer

      Foyer

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 13:00 14:30
      Lunch 1h 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 14:30 18:00
      Tests and simulations Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 14:30
        Accurate Abstraction and High Level Modeling and Validation of SEE in Electronic Systems 1h

        In this talk, we will be discussed the practical use of formal based techniques, such as SAT, SMT and probabilistic model checker to analyze SEEs at logical and higher abstraction levels. Through examples, we will illustrate each approach and its benefits.

        Speaker: Dr Otmane Ait Mohamed (University Concordia)
      • 15:30
        Fault Injection Methodologies 1h

        Fault injection is a widely used method to evaluate fault effects and error mitigation in a design. While not a replacement for standard Radiation- Hardness Assurance methodologies, it can provide valuable information in a quick and inexpensive manner. Moreover, recent developments have improved performance by several orders of magnitude, thus enabling the realization of extremely large fault injection campaigns. Today, fault injection can be used to forecast the expected circuit behaviour in the occurrence of SEUs and SETs, validate error mitigation approaches and detect weak areas that require error mitigation. This talk will review the most relevant fault injection methods, covering software-based techniques, simulation techniques and FPGA-based emulation techniques. Recent advances for SET and MCU emulation will also be presented.

        Speaker: Prof. Luis Entrena Arrontes (Universidad Carlos III Madrid)
      • 17:00
        Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases 1h

        This presentation describes a method devoted to SEU error-rate prediction for processor-based architectures. The proposed method combines results issued from fault-injection, performed at circuit by means of CEU (Code Emulated Upsets), to those issued from radiation ground tests. It allows predicting error rates without requiring radiation ground-tests for future applications. The approach was successfully applied to processors and FPGAs and is illustrated by three representative case-studies.

        Speaker: Dr Raoul Velazco (Laboratoire TIMA)
    • 16:30 17:00
      Coffee and posters 30m Foyer

      Foyer

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 18:00 18:30
      End of the days discussions 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:00 09:30
      Registration 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:30 13:00
      Mitigation and Hardening Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 09:30
        Mitigation in ASICs and FPGAs 1h
        Speaker: Mr Agustin Fernandez-Leon (ESA/ESTEC)
      • 11:00
        New Developments in FPGA: SEUs and Fail-Safe Strategies 1h

        Technology is changing at a fast pace. Transistor geometries are getting smaller, voltage thresholds are getting lower, design complexity is exponentially increasing, and user options are expanding. Consequently, reliable insertion of error detection and correction (EDAC) circuitry has become relatively challenging. As a response, a variety of mitigation techniques are being implemented. They range from weaker EDAC circuits that save area and power to strong mitigation strategies that come as a great expense to the system. Regarding FPGA and ASIC EDAC insertion, there is no “one-solution-fits-all.” The user must be aware of plethora of concerns. As an example, each FPGA device-type requires a different mitigation strategy for various reasons. This presentation will focus on the susceptibilities of a variety of FPGA types and ASICs in the avionics and space environment. In addition, the user will be provided information on what are the optimal mitigation strategies per FPGA and ASIC. Internal device component mitigation versus system level mitigation will also be discussed.

        Speaker: Mrs Melanie Berg (NASA - GSFC)
      • 12:00
        Development of a Hardened 150nm Standard Cell library 1h

        The effects produced by radiation on integrated circuits can be classified into Single Event Effects (SEE) related to transient problems and Total Ionization Dose (TID) effects that arise due to the long exposure time ionizing radiation. The mitigation of these effects on integrated circuits can be done in three ways: Manufacturing Process Level, Architectural Level (redundancy) and Layout Level. The work presented here deals with the third way of mitigation, that is, the cell library design of radiation tolerant integrated circuits. Designed and manufactured in silicon on 150nm technology, the SMDH-RH library is based on the use of guard rings and the application of closed geometry techniques (ELT – Enclosed Layout Transistor). The library includes simple and complex digital logic gates. It was tested in space as payload of a nanosatellite (NanosatC-Br1), launched in space in 2014 and still in activity, being approved its operation and functionality.

        Speaker: Joao Baptista dos Santos (Santa Maria Design House)
    • 10:30 11:00
      Coffee and posters 30m Foyer

      Foyer

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 13:00 14:30
      Lunch 1h 30m Restaurant/Lunchpad/ESCAPE

      Restaurant/Lunchpad/ESCAPE

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 14:30 18:00
      Tests and simulations Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 14:30
        Microprocessor testing: characterization tests, mitigation 1h

        Most satellites use radiation-hardened microprocessors, as many organizations are concerned that a microprocessor failure could be catastrophic to the mission. Most radiation hardened microprocessors are not as capable as commercial microprocessors, and the instrument's performance might be affected by the microprocessor's capability. Commercial microprocessors can be useful for secondary, non-mission computations so that the radiation-hardened microprocessor has more capacity for mission critical processing. Qualifying a commercial microprocessor for space usage can be quite complicated, though. This talk will highlight methods for characterizing microprocessors for SEE failures, methods for mitigating microprocessors, and open questions regarding microprocessor resilience. The talk includes a short introduction to computer architecture for several
        types of microprocessors.

        Speaker: Heather Quinn (Los Alamos National Laboratory)
      • 15:30
        Multi and Many core Processors: Fault tolerance and Radiation tests 1h

        This work evaluates the SEE static and dynamic sensitivity of a single-chip many-core processor having implemented 16 compute clusters, each one with 16 processing cores. A comparison of the dynamic tests when processing-cores cache memories are enabled and disabled is presented. The experiments were validated through radiation ground testing performed with 14 MeV neutrons on the MPPA-256 many-core processor manufactured in TSMC CMOS 28HP technology.

        Speakers: Prof. Pablo Ramos (Universidad de las Fuerzas Armadas-ESPE), Prof. Vanessa Vargas (Universidad de las Fuerzas Armadas-ESPE), Dr Raoul Velazco (Laboratoire TIMA)
      • 17:00
        Radiation tests of advanced SRAM memories 1h
        Speaker: Dr Juan Clemente (Universidad Complutense de Madrid)
    • 16:30 17:00
      Coffee and posters 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 18:00 18:30
      End of the day discussions 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 19:00 21:00
      Social Diner 2h Restaurant "La France", Rhijngeesterstraatweg 43, 2341 BR Oegstgeest

      Restaurant "La France", Rhijngeesterstraatweg 43, 2341 BR Oegstgeest

      Rhijngeesterstraatweg 43, 2341 BR Oegstgeest

      Limited amount of place

    • 09:00 09:30
      Registration 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:30 10:30
      Tests and simulations Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 09:30
        Laser Testing: Laser Simulation Test Possibilities and Facilities 1h

        Carrier generation induced by pulsed-laser excitation has become an essential tool for the investigation of single-event effects (SEEs) of micro- and nano-electronic structures. The qualitative capabilities of this approach include, among others, sensitive node identification, radiation hardened circuit verification, basic mechanisms investigations, model validation and calibration, screening devices for space missions, and fault injection to understand error propagation in complex circuits. Recent effort has built upon the success enabled by these qualitative benefits, and has focused on putting the laser SEE approaches on a more quantitative basis. This presentation will present the basic physics associated with the single-photon and two-photon excitation processes, as well as numerous case studies.

        Speaker: Dale McMorrow (Naval Research Laboratory)
    • 10:30 11:00
      Coffee and posters 30m Foyer

      Foyer

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 11:00 15:30
      Mitigation and Hardening Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 11:00
        Automotive safety challenges based on AEC Q100 / ISO 26262 requirement 1h
        Speaker: Sung Chung (QRT Inc.)
      • 12:00
        New Paradigm of error correction used for reliable embedded memories in aerospace applications 1h
        Speaker: Dr Fakhreddine Ghaffari (ENSEA)
      • 14:30
        Solar Cells 1h
        Speakers: Dr José Ramón González (ESA/ESTEC), Dr Carsten Baur (ESA/ESTEC)
    • 13:00 14:30
      Lunch 1h 30m Restaurant/Lunchpad/ESCAPE

      Restaurant/Lunchpad/ESCAPE

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 15:30 18:00
      Organization Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:00 09:30
      Registration 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 09:30 10:30
      Space and atmospheric environments Newton 1-2

      Newton 1-2

      ESA/ESTEC

      • 09:30
        Atmospheric radiation 1h
        Speaker: Prof. Frédéric WROBEL (University Montpellier 2 - IES)
    • 10:30 11:00
      Coffee and posters 30m Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 11:00 16:00
      COTS Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 11:00
        COTS in Space: Constraints, Limitations and Disruptive Capability 1h

        This talk describes one application of CNES methodology for allowing using commercial (COTS) digital electronic components in large spacecrafts. The required steps the components have to successfully pass before to be authorized to fly are presented. Then, the limitation concerning COTS usable performance is outlined. Even if these specificities reduce the attractiveness of commercial components, several project configurations are highlighted where COTS components are feasibility factor for the space mission due to their contribution to system performance.

        Speaker: Mr Michel Pignol (CNES)
      • 12:00
        COTS in Space: Qualified commercial components for space 1h

        Commercial electronics compared to their space qualified counterparts are increasingly proving to be fit for use in space. High performance and reliability together with reduction of qualification costs and less testing time play an important role in the development of the space market. Space- COTS are commercial components qualified for small satellite missions, which support the NewSpace technology development.

        Speaker: Mr Jaime Estela (Spectrum ARC GmbH)
      • 14:30
        COTS on ground: Ultra-High energies radiation test facilities 1h
        Speaker: Mr Ruben Garcia Alia (CERN)
      • 15:30
        COTS in Space: Experience and lessons learned at ESA 30m
        Speaker: Dr Karin Lundmark (ESA)
    • 13:00 14:30
      Lunch 1h 30m Restaurant/Lunchpad/ESCAPE

      Restaurant/Lunchpad/ESCAPE

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
    • 16:00 16:30
      Organization Newton 1-2

      Newton 1-2

      ESA/ESTEC

      Keplerlaan 1, 2200 AG Noordwijk The Netherlands
      • 16:00
        Concluding remarks 30m
        Speakers: Dr Raoul Velazco (Laboratoire TIMA), Dr Gregoire Deprez (ESA)