SERESSA International School 12-16 Nov. 2018

Speaker List

• Otmane Ait Mohamed (University Concordia)
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    Accurate Abstraction and High Level Modeling and Validation of SEE in Electronic Systems

• Sedki Amor (Institute of Information and Communication Technologies, Electronics and Applied Mathematics, Université catholique de Louvain, Place du Levant, 3, 1348 Louvain-la-Neuve, Belgium.)
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    On-membrane PD SOI MOSFET with micro-heater for TID in-situ annealing: experiments versus Eldo and Atlas simulations.

• Marko Andjelkovic (Associate researcher)
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    Modeling of SET Generation in Standard CMOS Logic Gates

• Joao Baptista dos Santos (Santa Maria Design House)
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    Development of a Hardened 150nm Standard Cell library

• Carsten Baur (ESA/ESTEC)
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    Solar Cells

• Melanie Berg (NASA - GSFC)
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    New Developments in FPGA: SEUs and Fail-Safe Strategies

• Ludovica Bozzoli (Politecnico di Torino)
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    Analysis and Design Techniques for Reconfigurable System Reliability in Harsh Environments

• Jan Broulim
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    Development of device for testing electronics in radiation harsh environment using Timepix detectors

• Stephen Buchner (United States Naval Research Laboratory)
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    Single Event Effects (SEE): Mechanisms and Classifications

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    Radiation Effects Hardness Assurance for space mission

• Matteo Cecchetto (CERN)
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    SEU screening using an Am-Be neutron source

• Si CHEN (Astroparticle and Cosmology Laboratory / CNRS)
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    Radiation-Hardening-By-Design for the Warm Front-End Electronics of the X-IFU/ATHENA Space Observatory

• Sung Chung (QRT Inc.)
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    Automotive safety challenges based on AEC Q100 / ISO 26262 requirement

• Juan Clemente (Universidad Complutense de Madrid)
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    Radiation tests of advanced SRAM memories

• Alessandra Costantino (ESA-ESTEC)
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    Technical training

• Gregoire Deprez (ESA)
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    Concluding remarks

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    Opening speeches and program overview

• Luis Entrena Arrontes (Universidad Carlos III Madrid)
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    Fault Injection Methodologies

• Jaime Estela (Spectrum ARC GmbH)
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    COTS in Space: Qualified commercial components for space

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    Technical training

• Hugh Evans (ESA/TEC-EPS)
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    Space Environments

• Agustin Fernandez-Leon (ESA/ESTEC)
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    Mitigation in ASICs and FPGAs

• Ruben Garcia Alia (CERN)
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    COTS on ground: Ultra-High energies radiation test facilities

• Fakhreddine Ghaffari (ENSEA)
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    New Paradigm of error correction used for reliable embedded memories in aerospace applications

• Jose Ramon Gonzalez (ESA-ESTEC)
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    Solar Cells

• Michael Holik (IEAP CTU in Prague; FEE UWB in Pilsen)
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    Development of the MIRAM radiation monitor

• Anežka Kabátová
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    Measurements using novel monolithic pixel radiation detectors

• Kenneth LaBel (NASA-GSFC)
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    EEE Parts in the New Space Paradigm

• Kyle Lewis (Texas Instruments)
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    ADC12DJ3200QML-SP SEE Radiation Testing Results

• David Lucsanyi (ESA ESTEC)
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    Simulating radiation effects of imaging detectors using Pyxel simulation framework

• Karin Lundmark (ESA)
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    COTS in Space: Experience and lessons learned at ESA

• Milan Malich
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    Development of read-out interfaces for pixel particle detector Timepix

• Pedro Martín-Holgado (CNA - Centro Nacional de Aceleradores)
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    Recent studies at the three irradiation facilities from the CNA and the coming upgrade.

• Dale McMorrow (Naval Research Laboratory)
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    Laser Testing: Laser Simulation Test Possibilities and Facilities

• Michele Muschitiello (ESA-ESTEC TEC-QEC)
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    Technical training

• Michel Pignol (CNES)
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    COTS in Space: Constraints, Limitations and Disruptive Capability

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    System Hardening and Real Applications

• Christian POIVEY (ESA)
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    TID and TNID

• Heather Quinn (Los Alamos National Laboratory)
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    Microprocessor testing: characterization tests, mitigation

• Pablo Ramos (Universidad de las Fuerzas Armadas-ESPE)
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    Multi and Many core Processors: Fault tolerance and Radiation tests

• Luca Sterpone (Politecnico di Torino)
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    SEE effects on VLSI devices (ASIC and FPGA)

• Kozo Takeuchi (Japan aerospace exploration agency)
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    Single Event Effects Induced by Heavy Ion and Single Photon Pulsed Laser Irradiation on Atom Switch based Field Programmable Gate Array

• Konstantin Tapero
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    Single Event Effects Test Methods

• Matěj Vaculčiak (Czech Technical University)
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    The SpacePix radiation monitor (SXRM)

• Vanessa Vargas (Universidad de las Fuerzas Armadas-ESPE)
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    Multi and Many core Processors: Fault tolerance and Radiation tests

• Raoul Velazco (Université Grenoble-Alpes / TIMA)
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    Concluding remarks

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    Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases

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    Multi and Many core Processors: Fault tolerance and Radiation tests

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    Opening speeches and program overview

• Frédéric WROBEL (University Montpellier 2 - IES)
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    Atmospheric radiation

• Jan Zich (University of West Bohemia)
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    Single Event Effect Tester for SmartFusion2 FPGAs