12-16 November 2018
Europe/Amsterdam timezone

ADC12DJ3200QML-SP SEE Radiation Testing Results

Not scheduled
Newton 1-2 (ESA/ESTEC)

Newton 1-2


Keplerlaan 1, 2200 AG Noordwijk The Netherlands
Poster Tests and simulations Tests and simulations


Kyle Lewis (TI)


The ADC12DJ3200QML is an RF-sampling giga-sample ADC that can directly sample input frequencies from DC to above 10 GHz. In dual channel mode, ADC12DJ3200 can sample up to 3200-MSPS and in single channel mode up to 6400-MSPS. Programmable tradeoffs in channel count (dual channel mode) and Nyquist bandwidth (single channel mode) allow development of flexible hardware that meets the needs of both high channel count and wide instantaneous signal bandwidth applications. Full power input bandwidth (-3 dB) of 7.0 GHz, with usable frequencies exceeding the -3 dB point in both dual and single channel modes, allows direct RF sampling of L-band, S-band, C-band and X-band for frequency agile systems.

ADC12DJ3200 uses a high speed JESD204B output interface with up to 16 serialized lanes and subclass-1 compliance for deterministic latency and multi-device synchronization. The serial output lanes support up to 12.8 Gbps and can be configured to trade-off bit rate and number of lanes. Innovative synchronization features, including noiseless aperture delay (TAD) adjustment and SYSREF windowing, simplify system design for phased array radar and MIMO communications. Optional digital down converters (DDCs) in dual channel mode allow for reduction in interface rate (real and complex decimation modes) and digital mixing of the signal (complex decimation modes only).

The ADC12DJ3200QML was put through heavy ion testing using the TAMU 15 MeV K500 Cyclotron. The device was monitored for Single Event Latch-up (SEL), Single Event Functional Interrupt (SEFI) and Single Event Upset (SEU).

A summary of the testing is as follows:
• The ADC’s JESD204B link always self-recovers from radiation events and without user intervention.
• The ADC exhibits no functional interrupts (SEFI) or performance degradations under the beam.
• No user-programmable or fuse-backed device registers are corrupted under the beam.
• Calibration vectors are not corrupted under the beam while running in either foreground or background calibration modes.
• The ADC12DJ3200 does not exhibit SEL beyond an LET of 120 MeV cm^2 / mg using datasheet maximum supply voltages and Tj = 125C.
• The total ionizing dose (TID) rating of the ADC12DJ3200 is 300 krad(Si).

Primary author


Presentation Materials

There are no materials yet.