SERESSA International School 12-16 Nov. 2018

Material Package

Added Since

Include only attachments uploaded after this date

Include*

Everything

Specific sessions

Specific contributions

Specific days

Sessions*

Organization

Radiation effects (SEE, TID, TNID)

Tests and simulations

Space and atmospheric environments

Mitigation and Hardening

COTS

Include materials from selected sessions

Contributions*

Accurate Abstraction and High Level Modeling and Validation of SEE in Electronic Systems (in session "Tests and simulations")

Atmospheric radiation (in session "Space and atmospheric environments")

Automotive safety challenges based on AEC Q100 / ISO 26262 requirement (in session "Mitigation and Hardening")

Coffee and posters (in session "Organization")

Concluding remarks (in session "Organization")

COTS in Space: Constraints, Limitations and Disruptive Capability (in session "COTS")

COTS in Space: Experience and lessons learned at ESA (in session "COTS")

COTS in Space: Qualified commercial components for space (in session "COTS")

COTS on ground: Ultra-High energies radiation test facilities (in session "COTS")

Development of a Hardened 150nm Standard Cell library (in session "Mitigation and Hardening")

EEE Parts in the New Space Paradigm (in session "Mitigation and Hardening")

Error-rate Prediction for Programmable Circuits: Methodology, Tools and Studied Cases (in session "Tests and simulations")

ESTEC High Bay and test rooms visit (in session "Organization")

Fault Injection Methodologies (in session "Tests and simulations")

Laser Testing: Laser Simulation Test Possibilities and Facilities (in session "Tests and simulations")

Microprocessor testing: characterization tests, mitigation (in session "Tests and simulations")

Mitigation in ASICs and FPGAs (in session "Mitigation and Hardening")

Multi and Many core Processors: Fault tolerance and Radiation tests (in session "Tests and simulations")

New Developments in FPGA: SEUs and Fail-Safe Strategies (in session "Mitigation and Hardening")

New Paradigm of error correction used for reliable embedded memories in aerospace applications (in session "Mitigation and Hardening")

Opening speeches and program overview (in session "Organization")

Radiation Effects Hardness Assurance for space mission (in session "Mitigation and Hardening")

Radiation tests of advanced SRAM memories (in session "Tests and simulations")

SEE effects on VLSI devices (ASIC and FPGA) (in session "Radiation effects (SEE, TID, TNID)")

Single Event Effects (SEE): Mechanisms and Classifications (in session "Radiation effects (SEE, TID, TNID)")

Single Event Effects Test Methods (in session "Radiation effects (SEE, TID, TNID)")

Solar Cells (in session "Mitigation and Hardening")

Space Environments (in session "Space and atmospheric environments")

System Hardening and Real Applications (in session "Mitigation and Hardening")

Technical training (in session "Organization")

TID and TNID (in session "Radiation effects (SEE, TID, TNID)")

Include materials from selected contributions

Events scheduled on*

12/11/2018

13/11/2018

14/11/2018

15/11/2018

16/11/2018

Include materials from sessions/contributions scheduled on the selected dates