Speakers
André Martins Pio De Mattos
(LIRMM)
Douglas Almeida dos Santos
(LIRMM)
Luigi Dilillo
(LIRMM)
Description
Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results