Speaker
Description
With the “New Space” approach, space is envisioned to become accessible and affordable to all with the development of low-cost satellite systems. A large part of this dream revolves around using commercially available high-performance electronic components and systems. However, a key barrier to the widespread usage of COTS parts in space is the harsh natural radiation environment. In this tutorial, an overview of the single-event effects impacting advanced semiconductor nodes will be discussed. Key metrics for designing SEE tests, such as sample preparation, biasing conditions, thermal impacts, internal fault tolerance mechanisms, etc. will be covered. Being able to determine the interplay of these variables is an integral part of designing a test to meet the needs of a specific mission. The short course will also explore designing test fixtures, selection of test facilities, executing tests, and analyzing test data. Efficacies and limitations of board-level SEE testing, as opposed to component-level SEE testing, for evaluating the vulnerability of COTS components for application in space, will also be discussed.
