Speaker
Description
Abstract
FPGAs and SoCs are well-suited for complex designs and evolving algorithms in terrestrial and space applications, especially compared to ASICs. This tutorial covers SRAM and non-volatile FPGA architectures, their evolution into modern Adaptive SoCs, and mechanisms behind Single Event Effects (SEE) and Total Ionizing Dose (TID). We’ll also explore how Functional Safety, RAS, and AI/ML applications have impacted SEE metrics, mitigation, and testing. It includes error classifications, mitigation strategies, testing methods, and results. The final section addresses challenges and solutions for next-gen markets, including telecom, automotive, data centers, avionics, and defense sectors.
Biography
Dr. Pierre Maillard leads the Radiation Effects & RAS Solutions team at AMD’s Adaptive Embedded Computing Group (AECG), focusing on the architecture, development, and validation of radiation-tolerant FPGA and SoCs solutions for markets such as Telecom, Avionics, Automotive, Datacenters, AI, Defense and Space. He has more than 20 issued patents in radiation effects on electronics and is a Senior Member of IEEE, with over 20 publications and presentations in industry-leading conferences and journals. Dr. Maillard holds M.S. and Ph.D. degrees in Electrical Engineering from Vanderbilt University and an M.S. from the University of Montpellier II.
