Speaker
Description
Abstract
For space systems, particle ionization can cause faults in microelectronics that inhibit operation and hence reduce reliability. In turn, radiation hardness assurance methods have been developed to perform system failure analyses. These practices have been applied for decades and are now in need of being modernized for better characterization of today’s complex system applications. This presentation describes what is required to test and analyze complex components such as SoC and FPGA devices, how conventional methods are insufficient, and how new methods can provide optimal coverage for failure analyses.
Biography
Mrs. Melanie Berg has over 35-years of experience as a designer, verification engineer, instructor, and reviewer for ASIC and FPGA applications. Her more visible accomplishments are her contributions to the FPGA designs for the NASA sponsored New Horizons Pluto and Beyond Mission; and her research/development in mitigation strategies. Melanie is a member of the Radiation Effects and Analysis group at NASA/GSFC; and is the founder/CEO of Space R3 LLC. She has published and presented several papers regarding: ionization and microelectronic error-response characterization, reliable synchronous design methodology, robust verification techniques, mitigation strategies for critical circuitry, reliability/survivability prediction calculations, and hardness assurance for space flight systems.
