12–16 Jun 2016
Gothenburg, Sweden
Europe/Amsterdam timezone

Session

Radiation tests of analogue and mixed-signal ICs

15 Jun 2016, 10:00
Gothenburg, Sweden

Gothenburg, Sweden

Conveners

Radiation tests of analogue and mixed-signal ICs

  • Fredrik Sturesson (Cobham Gaisler)

Presentation materials

There are no materials yet.

  1. Dr Sharp Richard (Cobham RAD Solutions)
    15/06/2016, 10:00
    AMICSA: Radiation tests of analogue and mixed-signal ICs
    Oral
     The pros and cons of in situ testing – going beyond the test standards Richard Sharp and Jiri Hofman, Cobham RAD Solutions Abstract— This paper discusses the benefits of in situ testing compared with the common practice of remote testing at a small number of total dose steps. INTRODUCTION TOTAL dose radiation testing of electronic components for use in space environments is frequently...
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  2. Prof. Melahat Bilge DEMIRKOZ (Middle East Technical University)
    15/06/2016, 10:20
    AMICSA: Radiation tests of analogue and mixed-signal ICs
    Oral
    Radiation testing of in-house developed GaAs-based Solid State Power Amplifiers (SSPAs) operating at super high frequencies (SHF) has been performed with a Co-60 source. GaAs-based electronic components are considered to be generally immune against Total Ionizing Dose (TID). Test results are presented here to quantify residual performance degradations of these SSPAs at various total ionizing...
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