12-16 November 2018
Europe/Amsterdam timezone

SEE effects on VLSI devices (ASIC and FPGA)

12 Nov 2018, 16:00
Newton 1-2 (ESA/ESTEC)

Newton 1-2


Keplerlaan 1, 2200 AG Noordwijk The Netherlands


Prof. Luca Sterpone (Politecnico di Torino)


Radiation effects on VLSI technology are provoked when radiation particles such as neutrons, protons or heavy ions hit a sensitive region of the integrated circuits. Due to the progressive technology scaling, VLSI devices are becoming, more and more vulnerable to Single Event Effects (SEEs) and are subject to cumulative ionizing damage known as Total Ionization Dose (TID). This talk will firstly describe the state-of-the-art methodologies used for analysing the impact of radiation effects on modern FPGAs and ASICs by means of Computer Aided Design (CAD) tools and secondly, it will describe the state-of-the-art CAD design techniques for their mitigation.

Primary author

Prof. Luca Sterpone (Politecnico di Torino)

Presentation Materials