12-16 November 2018
Europe/Amsterdam timezone

Development of device for testing electronics in radiation harsh environment using Timepix detectors

Not scheduled
Newton 1-2 (ESA/ESTEC)

Newton 1-2


Keplerlaan 1, 2200 AG Noordwijk The Netherlands
Poster Radiation effects Radiation effects (SEE, TID, TNID)


Jan Broulim


Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs timely and spatially correlated with Timepix detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized with Timepix readout (Timepix and spectrometer readout interface) and a replaceable Device Under Test (DUT), which can consists of various type of circuits, including D flip-flops, Random Access Memory (RAMs), or Field Programmable Gate Arrays (FPGAs).

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