Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs timely and spatially correlated with Timepix detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized with Timepix readout (Timepix and spectrometer readout interface) and a replaceable Device Under Test (DUT), which can consists of various type of circuits, including D flip-flops, Random Access Memory (RAMs), or Field Programmable Gate Arrays (FPGAs).