12-16 November 2018
Europe/Amsterdam timezone

Single Event Effect Tester for SmartFusion2 FPGAs

Not scheduled
Newton 1-2 (ESA/ESTEC)

Newton 1-2


Keplerlaan 1, 2200 AG Noordwijk The Netherlands
Poster Commercial Off-The-Shelf components COTS


Jan Zich (University of West Bohemia)


Single Event Effects (SEE) are the main type of electronics failures when a device operates under extreme harsh conditions, i. e. particle accelerators or space environment. SmartFusion2 FPGA is produced as a radiation-tolerant device with some operability under such conditions. In this work, a test device for checking the reliability and aging of the FPGA is presented. The tester is based on parallel shift register structures, which are sequentially filled with the set of different test vectors in order to detect errors caused by SEE. Redundant memory circuits are dedicated to store error count, timestamps and in-chain error position securely. As the latch-up effect may appear, the additional power reset circuitry is added. Therefore the SEE tester is prepared for long-term autonomous testing in laboratory (radon decay) and even for application oriented tests (Large Hadron Collider in CERN).

Primary authors

Jan Zich (University of West Bohemia) Michael Holik (IEAP CTU in Prague; FEE UWB in Pilsen) Milan Malich Jan Broulim (University of West Bohemia)

Presentation Materials