Abstract: For critical space-applications, single event upset (SEU) data are gathered to determine if the mission’s survivability requirements are satisfied. When performing failure analysis on a mission’s FPGA applications, it is common practice to use simple test structures that focus on the FPGA’s discrete internal components. It is also common practice that SEU parameters obtained from said simple FPGA test structures (generic data) are extrapolated to fit tactical and used by survivability tools to predict mission success. Unfortunately, the fidelity of generic SEU data extrapolation to mission-tactical applications is problematic. Alternatively, to improve the fidelity of data characterization, it is better practice to use representative tactical designs as SEU test structures. However, this process requires SEU testing for every FPGA design; and can be impractical.
This presentation addresses how to obtain (and use) proper SEU data for (mission-critical) tactical application survivability analysis; while reducing the need to perform SEU testing on every design.