Speaker
Dr
Luis Carranza González
(Alter Technology TÜV Nord)
Description
This paper presents a flexible Single Event Effect (SEE) test system designed to detect and record Single Event Upsets (SEU), Single Event Transients (SET), Single Event Functional Interrupts (SEFI) and Single Event Latch-ups (SEL) that may arise in digital and mixed-signal ICs from irradiation by heavy ions. The test system is based on a digital core synthesized on an FPGA, a Cortex-M3 Armv7-M microcontroller and miscellaneous circuitry devoted to providing the required supply voltages, process SEL phenomena, generate and process input/output test signals and monitor key voltage levels.
Primary author
Dr
Luis Carranza González
(Alter Technology TÜV Nord)
Co-authors
Mr
Álvaro Ricca Soaje
(Alter Technology TÜV Nord)
Mr
Gonzalo De las Cuevas Gómez
(Alter Technology TÜV Nord)
