16–18 Jun 2025
Universidade Nova de Lisboa
Europe/Berlin timezone

Session

Data Converters

ADC
17 Jun 2025, 11:00
Rectorship building (Universidade Nova de Lisboa)

Rectorship building

Universidade Nova de Lisboa

Lisbon

Description

High-Integrity Data Converters: Bridging Analog and Digital in Radiation-Prone Missions

Presentation materials

There are no materials yet.

  1. Dr Bjorn Van Bockel (Magics Technologies)
    17/06/2025, 11:00
    Custom Cell, Circuit, and System Design

    A rad-hard by design Time-to-Digital Converter is presented with a single-shot precision of 8 ps and a zero dead zone measurement range of 0 ps up to 3s. The analog and digital building blocks and the overall chip architecture are developed for radiation performance, to support time of flight and time tagging applications in space.

    Go to contribution page
  2. Zheyi Li (IMEC)
    17/06/2025, 11:30
    Custom Cell, Circuit, and System Design

    In space-related projects, radiation effects such as Total Ionizing Dose (TID) effects and Single Event Effects (SEEs) are the main threat to the microelectronic conponents. ADCs, which are the crucial components of the telecommunication chain, are also facing these challenges. Radiation hardening is mandatory for the assurance of function and performance for ADC, which usually brings...

    Go to contribution page
  3. Mrs Heline Barneoud (Teledyne e2v)
    17/06/2025, 12:00
    Space Applications

    This paper presents a compact, high-speed 10-bit wideband data converter for direct conversion of the microwave spectrum up to 40 GHz (Ka-band). With a 33 GHz input bandwidth, it supports RF direct sampling at 12.8 GSps with only 2.5W power consumption, eliminating the need for external mixers and simplifying system design. NPR performance has been measured up to 40 GHz, making it ideal for...

    Go to contribution page
  4. Dr Fábio Passos (Instituto Superior Técnico), Dr Hugo Serra (UNINOVA), Dr João Goes (UNINOVA)
    17/06/2025, 12:30
    Space Applications

    This paper presents the design, implementation, and experimental validation of a 14-bit 80 MS/s calibration-free radiation-hardened pipeline analog-to-digital converter (ADC) realized in 28-nm bulk-CMOS technology. The escalating demand for high-performance ADCs in radiation-rich environments necessitates robust designs capable of withstanding ionizing radiation-induced errors without...

    Go to contribution page
Building timetable...