Speaker
Mr
Jesús López
(Arquimea Ingeniería S.L.U)
Description
The purpose of this paper is to present the electrical and radiation results of the tests performed on the LVDS Octal repeater developed by ARQRUIMEA in the frame of ESA’s and ECI’s European LVDS Driver Development intended to be used in space applications and built in IHP’s 0.25-um BiCMOS process technology.
The key features of the octal LVDS repeater include cold sparing, more than 250MHz signaling rate per channel allowing more than 500Mbps transfer rates over SpiceWire, 3.3V single power supply, low channel to channel skew, TRI-state output control, extended common mode on LVDS receivers and t ESD tolerance up to of 8kV for human body model
The Octal LVDS repeater has been tested up to 300Krad without important degradation. Additionally, the devices have shown no sensitivity to Latch-up up to the maximum tested LET of 62.5 MeV cm2/mg. The octal repeater is not sensitive to SET or SEU up to 20 MeV cm2/mg. At higher 62.5 MeV cm2/mg 15 bit errors were detected after 1012 transmitted bits.
Primary authors
Mr
Enrique Cordero
(Alter)
Mr
Jesús López
(Arquimea Ingeniería S.L.U)
Dr
Maurizio Cirillo
(IHP)
Mr
Rok Dittrich
(ESA)
Co-authors
Mr
Adrien Frouin
(Arquimea Ingeniería S.L.U)
Mr
Daniel Gonzalez
(Arquimea Ingenieria S.L.U)
Demetrio López
(Alter)
Dr
Richard Jansen
(ESA)
