Speaker
Dr
Sonia Vargas-Sierra
(Alter Technology)
Description
This paper reports the testing results of a SuccessiveApproximation-Register
(SAR) ADC of 18-bits with Serial
Input/Output digital interface. We compare the results of using a
standard approach with a new test methodology for SAR static
linearity testing. The available test time in between radiation steps is
limited in order to avoid annealing. The presented method strongly
reduces the amount of output code samples, which implies not only
higher test speed but also lower test cost.
In high resolution ADCs, performing linearity test using
the standard histogram method implies obtaining a large
number of samples per code in order to average the
measurement noise. This leads to long test time which involve
high test costs. Space applications nowadays are trending to the
use of COTS devices for cost saving purposes. This is aligned
with a reduction in the cost of testing such COTS components.
The present work has shown that it is possible to reduce the cost
of the linearity test reducing the number of necessary samples.
This is done by improving the noise averaging efficiency by
using the very accurate input signal information dismissed in
the accumulation of the histogram, redistribute the contribution
of noise average to all samples and taking care of the high
dependence behavior of segmented architectures of some types
of high resolution ADCs.
Summary
This paper presents the characterization results under Total Ionization Dose (TID) radiation using a Cobalt-60 source of a commercial 18-bit Serial IO Analog to Digital Converter AD7982 of Analog Devices. This converter is a Successive Approximation Register (SAR) type with no missing codes, maximum INL = ±2LSB and typical DR=99dB. It has differential input of maximum ±5V, no pipeline delay and works at a maximum sample rate 1 MSPS. This device uses a serial peripheral interface which is SPI/QSPI/MICROWIRE/DSP compatible. The chosen package to be tested is the 3mmx3mm 10-Lead LFCSP.
Primary author
Dr
Sonia Vargas-Sierra
(Alter Technology)
Co-authors
Dr
Eduardo Peralías
(IMSE-CNM (CSIC))
Mr
Francisco Javier Galnares
(Alter Technology)
Mrs
María Angeles Jalón
(Alter Technology)
