28–29 Nov 2023
European Space Research and Technology Centre (ESTEC)
Europe/Amsterdam timezone

Speeding up DO-178C Safety Certification with Trace-based Code Coverage

28 Nov 2023, 15:00
30m
European Space Research and Technology Centre (ESTEC)

European Space Research and Technology Centre (ESTEC)

Keplerlaan 1 2201AZ Noordwijk ZH The Netherlands

Speaker

Mr Ladislav Řehák (Lauterbach)

Description

Collecting code coverage information is required for all the common software certification processes, including the one defined by DO-178C. This is usually a challenge because traditional code coverage measurement requires extensive code instrumentation which has all kinds of side effects like (additional) memory consumption, slowing down the execution, and much more. After discussing the overall added value of Lauterbach’s real-time-trace debug features for developers of any embedded application, this presentation explores the advantages of Trace-based Code Coverage for integration and system tests and demonstrates a practical example using an NG Ultra SoC by NanoXplore. We will observe and discuss the advantages of minimal or even zero code instrumentation used for Lauterbach’s new trace-based measurement method compared with the traditional source code instrumentation.

Presentation materials

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