Speaker
Simone Gerardin
(DEI - University of Padova)
Description
A heavy-ion beam monitor based on 3D NAND Flash memories was designed and tested with heavy ions at high energy and low LET. The capability of measuring fluence, angle, uniformity, and LET of impinging particles is discussed, together with the advantages over SRAM-based implementations. We propose ad-hoc algorithms for the extraction of the beam parameters, based only on user-mode commands. A validation of the system using low-LET ionizing particles impinging at different angles is presented. Experimental results show very good efficiency and accuracy.
Primary authors
Alessandra Costantino
(ESA-ESTEC)
Alessandro Paccagnella
(DEI - University of Padova)
Anastasia Pesce
(ESA)
Giovanni Santin
(ESA)
Kay-Obbe Voss
(GSI Darmstadt)
Marta Bagatin
(DEI - University of Padova)
Silvia Beltrami
(Micron Technology)
Simone Gerardin
(DEI - University of Padova)
Veronique Ferlet-Cavrois
(ESA)
