imec.IC-link
Author in the following contributions
- DARE22 Test Vehicle Design for a 22nm FDSOI process
- Radiation Hardened by Design SONOS embedded Non-Volatile Memory in 180nm
- Validation, Characterization and Irradiation Testing of the DARE65T Platform
- First Silicon Enabling Rad-Hard Non-Volatile Memory in 22nm Technology for Space Applications
- Detailed SET Ionized Charge and Pulse Duration Measurement of a 65 nm CMOS Technology