TEC-QEC Final Presentation days

Jun 28, 2023, 9:30 AM → Jun 30, 2023, 6:00 PM Europe/Amsterdam

ESTEC - Tennis Hall (ESA )

TEC-QEC

Final Presentation Day

 

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Radiation Hardness Assurance & Component Analysis Section (TEC-QEC) Final Presentation days

TEC-QEC Final Presentation Days will take place from on the 28-30 June 2023 at ESTEC.

During the event the major R&D activities and studies coordinated by TEC-QEC concluded between 2019 and 2022 will be presented .
 

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Registration is required for external visitors to access the venue. (No participation fee)

Wed, June 28

2:00 PM → 2:15 PM Welcome & Introduction

Convener: Christian POIVEY (ESA)

2:15 PM → 5:50 PM Session 1: Facilities and Test Methods

Convener: Alessandra Costantino (ESA)

2:15 PM Integreted approach for SEE robust design

Comparison between Board level and component level testing (OSIP )

Speaker: Cesar Pablo Fernandez (Sener)

Integrated approach for SEE Robust Design_CesarPabloFernandez.pptx

2:35 PM SEE testing with laser beam, guidelines

Speaker: Vincent POUGET (IES - CNRS)

3.2023-06-28 ESA TEC-QEC - Pouget.pdf

Single-Event Effects Testing with a Laser Beam - Guidelines.pdf

3:05 PM Adoption of SEE laser testing as part of the RHA process for COTS screening and validation

Speakers: Sébastien Morand (Airbus DS), Renaud Mangeret (Airbus DS), Jérémy Guillermin (TRAD), Samuel Dubos (TRAD)

fpd_itt_rha_cots_laser_rc1.2.pptx

3:30 PM Board level testing

Speakers: Guillaume Montay (Sodern), Matthieu Beaumel (Sodern)

1_4_2023.06.28_ESAfpd_BoardLevelTesting_Sodern5.pptx

3:50 PM Coffee Break

4:05 PM RADEF - Facility activities overview and updates

Speaker: Heikki Kettunen (University of Jyväskylä, Department of Physics)

20230628 RADEF.pptx

4:25 PM UCL - Facility activities overview and updates

Speakers: Nancy Postiau (Université catholique de Louvain), Laurent Standaert (Université catholique de Louvain)

Présentation_CRC.pdf

4:45 PM PSI - Facility activities overview and updates

Speaker: Wojtek Hadjas (PSI)

8.PIF_ESA_FPD_28.06.2023_v1.0.pdf

5:05 PM CHIMERA - Facility activities overview and updates

Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN), Ruben Garcia Alia (CERN)

9.TEC_QEC_FP_AW_2_Chimera.pdf

6:00 PM → 7:00 PM Lab Visit : Materials and EEE component (Optional)

Thu, June 29

9:40 AM → 9:55 AM Welcome & Introduction

9:55 AM → 11:55 AM Session 2: In flight Data and Mission specific testing

Convener: Marc Poizat (ESA)

9:55 AM BepiColombo Radiation Monitor

Speaker: Marco Pinto (ESA)

TEC-QEC-FPD.pptx

10:15 AM In-Orbit results from Celesta

Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN/ESA/UZH), Raffaello Secondo (CERN), Ruben Garcia Alia (CERN)

2.In-orbit results from CELESTA.pptx

10:35 AM Coffee Break

10:55 AM Radiation-induced SEL in a COTS SRAM memory - Test and Flight data

Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results

Speakers: André Martins Pio De Mattos (LIRMM), Douglas Almeida dos Santos (LIRMM), Luigi Dilillo (LIRMM)

3.Radiation-Induced SEL in COTS SRAM Memory.pdf

11:15 AM Part 1: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission

Speakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)

4.Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission.pdf

11:35 AM Part 2: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission

Speaker: Maximilien Glorieux (IROC)

AO8191_20230629_TEC-QEC_v1.pdf

11:55 AM → 4:15 PM Session 3: Technology Studies

Convener: Christian POIVEY (ESA)

11:55 AM Lessons learned for SDRAM testing

Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)

Speaker: Said Bounasser (ESA)

6.SB_QEC_FinalPresentation.pdf

6.SB_QEC_FinalPresentation.pptx

12:20 PM Lunch Break

2:00 PM Part 1: Estimation of proton induced single event rate in very deep submicron technologies

Speakers: Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)

Part 1 - Estimation of proton induced single event rate in very deep submicron technologies.pdf

2:20 PM Part 2: Estimation of proton induced single event rate in very deep submicron technologies

Speakers: Laurent Artola (ONERA), Maximilien Glorieux (IROC)

Estimation of Proton induced Single-Event rate in very-deep_v2.pdf

2:40 PM MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization

Speakers: Fernando Romero Madera (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)

MOSFET commercial plastic components survey and its SEE behaviour_v3.pptx

3:00 PM Part 1: Radiation screening of COTS components and verification of COTS RHA approach

Speakers: Christoph Tscherne (Seibersdorf Laboratories), Peter Beck (Seibersdorf Laboratories)

Tscherne_CORHA_ESA_FPD_v1.0.pdf

3:20 PM Part 2: Radiation screening of COTS components and verification of COTS RHA approach

Speakers: Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)

CORHA Part 2 - Radiation screening of COTS components and verification of COTS RHA approach.pdf

3:40 PM Coffee Break

4:10 PM → 4:50 PM Session 4: Radiation Test Results

Convener: Viyas Gupta (ESA)

4:10 PM RACOCO

Speakers: Jochen Kuhnhenn (Fraunhofer), Michael Steffens (Fraunhofer), Stefan Hoeffgen (Fraunhofer)

13.Fraunhofer_RACOCO_FinalPresentationDays_2023-06-29_v1.0.pdf

4:30 PM Test Results on SDRAM IS42S86400B-7TLI

Laser test results of the IS42S86400B-7TLI to explain the different SEFI mechanisms

Speaker: Maximilien Glorieux (IROC)

Test Results on SDRAM IS42S86400B-7TLI.pdf

4:50 PM → 5:10 PM Annex Session

4:50 PM Introduction: Master RADMEP

Speaker: Paul Leroux (KU Leuven)

15.EMJMD RADMEP - ESA -2023.pptx

5:30 PM → 7:00 PM Cocktail

6:30 PM → 7:30 PM Lab Visit : Materials and EEE component (Optional)

Fri, June 30

9:15 AM → 9:30 AM Welcome & Introduction

Convener: Viyas Gupta (ESA)

9:30 AM → 12:00 PM Session 4: Radiation Test Results

9:30 AM TID testing of statistically large quantitites of COTS parts

TID test results on a large quantity of a COTS LM239 voltage comparator from 2 different vendors

Speaker: Richard Sharp (Radtest Ltd)

Sharp - TID testing of statistically.pptx

9:50 AM SEE tests on power Schottky Diodes

Speakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)

SEE tests on power Schottky Diodes.pdf

10:10 AM Coffee Break

10:40 AM Heavy Ion SEE Testing of Microsemi RTG4 flash based FPGA

SEE of a two LEON FT core processor design in RTG4 FPGA

Speaker: Richard Sharp (Radtest Ltd)

3.Sharp - RTG4.pptx

11:00 AM Heavy ion failure rate computation based on sensitive volume characterization in GaN/AlGaN FETs

Speaker: Sébastien Morand (Airbus Defence and Space)

fpd_osip_GaN_rev4.pdf

1:00 PM → 2:00 PM Lab Visit : Materials and EEE component (Optional)