TEC-QEC Final Presentation days

28 Jun 2023, 09:30 → 30 Jun 2023, 18:00 Europe/Amsterdam

ESTEC - Tennis Hall (ESA )

TEC-QEC

Final Presentation Day

 

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Radiation Hardness Assurance & Component Analysis Section (TEC-QEC) Final Presentation days

TEC-QEC Final Presentation Days will take place from on the 28-30 June 2023 at ESTEC.

During the event the major R&D activities and studies coordinated by TEC-QEC concluded between 2019 and 2022 will be presented .
 

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Registration is required for external visitors to access the venue. (No participation fee)

Wednesday 28 June

14:00 → 14:15 Welcome & Introduction

Convener: Christian POIVEY (ESA)

14:15 → 17:50 Session 1: Facilities and Test Methods

Convener: Alessandra Costantino (ESA)

14:15 Integreted approach for SEE robust design

Comparison between Board level and component level testing (OSIP )

Speaker: Cesar Pablo Fernandez (Sener)

Integrated approach for SEE Robust Design_CesarPabloFernandez.pptx

14:35 SEE testing with laser beam, guidelines

Speaker: Vincent POUGET (IES - CNRS)

3.2023-06-28 ESA TEC-QEC - Pouget.pdf

Single-Event Effects Testing with a Laser Beam - Guidelines.pdf

15:05 Adoption of SEE laser testing as part of the RHA process for COTS screening and validation

Speakers: Sébastien Morand (Airbus DS), Renaud Mangeret (Airbus DS), Jérémy Guillermin (TRAD), Samuel Dubos (TRAD)

fpd_itt_rha_cots_laser_rc1.2.pptx

15:30 Board level testing

Speakers: Guillaume Montay (Sodern), Matthieu Beaumel (Sodern)

1_4_2023.06.28_ESAfpd_BoardLevelTesting_Sodern5.pptx

15:50 Coffee Break

16:05 RADEF - Facility activities overview and updates

Speaker: Heikki Kettunen (University of Jyväskylä, Department of Physics)

20230628 RADEF.pptx

16:25 UCL - Facility activities overview and updates

Speakers: Nancy Postiau (Université catholique de Louvain), Laurent Standaert (Université catholique de Louvain)

Présentation_CRC.pdf

16:45 PSI - Facility activities overview and updates

Speaker: Wojtek Hadjas (PSI)

8.PIF_ESA_FPD_28.06.2023_v1.0.pdf

17:05 CHIMERA - Facility activities overview and updates

Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN), Ruben Garcia Alia (CERN)

9.TEC_QEC_FP_AW_2_Chimera.pdf

18:00 → 19:00 Lab Visit : Materials and EEE component (Optional)

Thursday 29 June

09:40 → 09:55 Welcome & Introduction

09:55 → 11:55 Session 2: In flight Data and Mission specific testing

Convener: Marc Poizat (ESA)

09:55 BepiColombo Radiation Monitor

Speaker: Marco Pinto (ESA)

TEC-QEC-FPD.pptx

10:15 In-Orbit results from Celesta

Speakers: Andrea Coronetti (CERN), Andreas Waets (CERN/ESA/UZH), Raffaello Secondo (CERN), Ruben Garcia Alia (CERN)

2.In-orbit results from CELESTA.pptx

10:35 Coffee Break

10:55 Radiation-induced SEL in a COTS SRAM memory - Test and Flight data

Investigation on intra-die variability and radiation-induced SEL in a COTS SRAM memory flying on Proba-V + Flight data analysis of SEL in a COTS Samsung SRAM and comparison with SEE test results

Speakers: André Martins Pio De Mattos (LIRMM), Douglas Almeida dos Santos (LIRMM), Luigi Dilillo (LIRMM)

3.Radiation-Induced SEL in COTS SRAM Memory.pdf

11:15 Part 1: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission

Speakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)

4.Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission.pdf

11:35 Part 2: Risk Assessment of SEE Events due to High Energy Electrons during the Juice Mission

Speaker: Maximilien Glorieux (IROC)

AO8191_20230629_TEC-QEC_v1.pdf

11:55 → 16:15 Session 3: Technology Studies

Convener: Christian POIVEY (ESA)

11:55 Lessons learned for SDRAM testing

Set of recommendations for memory SEE stuck bit testing. (Stuck bits + ISB + SEFI + SEU)

Speaker: Said Bounasser (ESA)

6.SB_QEC_FinalPresentation.pdf

6.SB_QEC_FinalPresentation.pptx

12:20 Lunch Break

14:00 Part 1: Estimation of proton induced single event rate in very deep submicron technologies

Speakers: Arto Javanainen (Jyväskylä University), Bendy Tanios (Alter)

Part 1 - Estimation of proton induced single event rate in very deep submicron technologies.pdf

14:20 Part 2: Estimation of proton induced single event rate in very deep submicron technologies

Speakers: Laurent Artola (ONERA), Maximilien Glorieux (IROC)

Estimation of Proton induced Single-Event rate in very-deep_v2.pdf

14:40 MOSFET Commercial plastic components survey (Trenchfet,...) and its SEE characterization

Speakers: Fernando Romero Madera (Alter), José Francisco LARGAESPADA GÓMEZ (Alter)

MOSFET commercial plastic components survey and its SEE behaviour_v3.pptx

15:00 Part 1: Radiation screening of COTS components and verification of COTS RHA approach

Speakers: Christoph Tscherne (Seibersdorf Laboratories), Peter Beck (Seibersdorf Laboratories)

Tscherne_CORHA_ESA_FPD_v1.0.pdf

15:20 Part 2: Radiation screening of COTS components and verification of COTS RHA approach

Speakers: Marta Bagatin (DEI - University of Padova), Simone Gerardin (DEI - University of Padova)

CORHA Part 2 - Radiation screening of COTS components and verification of COTS RHA approach.pdf

15:40 Coffee Break

16:10 → 16:50 Session 4: Radiation Test Results

Convener: Viyas Gupta (ESA)

16:10 RACOCO

Speakers: Jochen Kuhnhenn (Fraunhofer), Michael Steffens (Fraunhofer), Stefan Hoeffgen (Fraunhofer)

13.Fraunhofer_RACOCO_FinalPresentationDays_2023-06-29_v1.0.pdf

16:30 Test Results on SDRAM IS42S86400B-7TLI

Laser test results of the IS42S86400B-7TLI to explain the different SEFI mechanisms

Speaker: Maximilien Glorieux (IROC)

Test Results on SDRAM IS42S86400B-7TLI.pdf

16:50 → 17:10 Annex Session

16:50 Introduction: Master RADMEP

Speaker: Paul Leroux (KU Leuven)

15.EMJMD RADMEP - ESA -2023.pptx

17:30 → 19:00 Cocktail

18:30 → 19:30 Lab Visit : Materials and EEE component (Optional)

Friday 30 June

09:15 → 09:30 Welcome & Introduction

Convener: Viyas Gupta (ESA)

09:30 → 12:00 Session 4: Radiation Test Results

09:30 TID testing of statistically large quantitites of COTS parts

TID test results on a large quantity of a COTS LM239 voltage comparator from 2 different vendors

Speaker: Richard Sharp (Radtest Ltd)

Sharp - TID testing of statistically.pptx

09:50 SEE tests on power Schottky Diodes

Speakers: Alexandre Rousset (TRAD), Jérémy Guillermin (TRAD)

SEE tests on power Schottky Diodes.pdf

10:10 Coffee Break

10:40 Heavy Ion SEE Testing of Microsemi RTG4 flash based FPGA

SEE of a two LEON FT core processor design in RTG4 FPGA

Speaker: Richard Sharp (Radtest Ltd)

3.Sharp - RTG4.pptx

11:00 Heavy ion failure rate computation based on sensitive volume characterization in GaN/AlGaN FETs

Speaker: Sébastien Morand (Airbus Defence and Space)

fpd_osip_GaN_rev4.pdf

13:00 → 14:00 Lab Visit : Materials and EEE component (Optional)